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101

Columnar-to-Equiaxed Transition in SOLidification Processing (CETSOL): A Project of the European Space Agency (ESA) - Microgravity Applications Promotion (MAP) Programme

Gandin, Charles-André, Billia, Bernard, Zimmermann, Gerhard, Browne, David J., Dupouy, M.D., Guillemot, G., Nguyen-Thi, Henri, Mangelinck-Noël, Nathalie, Reinhart, Guillaume, Sturz, Laszlo, McFadden,

Journal:

Materials Science Forum

Year:

2006

Language:

english

File:

PDF, 1.17 MB

english, 2006

102

Atom probe tomographic study of L10 martensite in a Pt-modified NiCoCrAlYTa bond coating

Tan, Xipeng, Perrin-Pellegrino, Carine, Hoummada, Khalid, Mangelinck, Dominique, Vande Put, Aurélie Rouaix, Lafont, Marie-Christine, Oquab, Djar, Monceau, Daniel

Journal:

Corrosion Science

Year:

2013

Language:

english

File:

PDF, 1.98 MB

english, 2013

103

Twinning occurrence and grain competition in multi-crystalline silicon during solidification

Tandjaoui, Amina, Mangelinck-Noel, Nathalie, Reinhart, Guillaume, Billia, Bernard, Guichard, Xavier

Journal:

Comptes Rendus Physique

Year:

2013

Language:

english

File:

PDF, 872 KB

english, 2013

104

Direct epitaxial growth of θ-Ni2Si by reaction of a thin Ni(10at.% Pt) film with Si(100) substrate

Panciera, Federico, Mangelinck, Dominique, Hoummada, Khalid, Texier, Michaël, Bertoglio, Maxime, De Luca, Anthony, Gregoire, Magali, Juhel, Marc

Journal:

Scripta Materialia

Year:

2014

Language:

english

File:

PDF, 940 KB

english, 2014

105

Effect of a weak transverse magnetic field on solidification structure during directional solidification

Li, X., Fautrelle, Y., Gagnoud, A., Du, D., Wang, J., Ren, Z., Nguyen-Thi, H., Mangelinck-Noel, N.

Journal:

Acta Materialia

Year:

2014

Language:

english

File:

PDF, 11.52 MB

english, 2014

106

Ni(Pt)-silicide contacts on CMOS devices: Impact of substrate nature and Pt concentration on the phase formation

Panciera, F., Hoummada, K., Perrin, C., El Kousseifi, M., Pantel, R., Descoins, M., Gregoire, M., Juhel, M., Mangelinck, D.

Journal:

Microelectronic Engineering

Year:

2014

Language:

english

File:

PDF, 4.53 MB

english, 2014

107

Kinetics study of NiPt(10 at.%)/Si0.7Ge0.3 solid state reactions

Bourjot, E., Putero, M., Perrin-Pellegrino, C., Gergaud, P., Gregoire, M., Nemouchi, F., Mangelinck, D.

Journal:

Microelectronic Engineering

Year:

2014

Language:

english

File:

PDF, 840 KB

english, 2014

108

Effect of alloying elements Mo and W on Ni silicides formation

Derafa, A., Tellouche, G., Hoummada, K., Bouabellou, A., Mangelinck, D.

Journal:

Microelectronic Engineering

Year:

2014

Language:

english

File:

PDF, 2.19 MB

english, 2014

109

Nature of the ZnSe/GaAs interface investigated by atom probe tomography

Benallali, H., Hoummada, K., Descoins, M., Rueda-Fonseca, P., Gerard, L., Bellet-Amalric, E., Tatarenko, S., Kheng, K., Mangelinck, D.

Journal:

Scripta Materialia

Year:

2013

Language:

english

File:

PDF, 656 KB

english, 2013

110

Direct observation of Ni decorated dislocation loops within As+-implanted silicon and arsenic clustering in Ni silicide contact

Hoummada, Khalid, Tellouche, Gamra, Blum, Ivan, Portavoce, Alain, Descoins, Marion, Mangelinck, Dominique

Journal:

Microelectronic Engineering

Year:

2013

Language:

english

File:

PDF, 4.03 MB

english, 2013

111

Effect of external stress on the Fe–Cr phase separation in 15-5 PH and Fe–15Cr–5Ni alloys

Danoix, F., Lacaze, J., Gibert, A., Mangelinck, D., Hoummada, K., Andrieu, E.

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 1.42 MB

english, 2013

112

Pt redistribution in N-MOS transistors during Ni salicide process

Panciera, F., Hoummada, K., Gregoire, M., Juhel, M., Mangelinck, D.

Journal:

Microelectronic Engineering

Year:

2013

Language:

english

File:

PDF, 1.96 MB

english, 2013

113

Atom probe tomography for advanced metallization

Mangelinck, D., Panciera, F., Hoummada, K., El Kousseifi, M., Perrin, C., Descoins, M., Portavoce, A.

Journal:

Microelectronic Engineering

Year:

2014

Language:

english

File:

PDF, 4.34 MB

english, 2014

114

Atom probe tomography of SRAM transistors: Specimen preparation methods and analysis

Panciera, F., Hoummada, K., Gregoire, M., Juhel, M., Lorut, F., Bicais, N., Mangelinck, D.

Journal:

Microelectronic Engineering

Year:

2013

Language:

english

File:

PDF, 2.04 MB

english, 2013

115

Silicide formation during reaction between Ni ultra-thin films and Si(001) substrates

Fouet, J., Texier, M., Richard, M.-I., Portavoce, A., Mangelinck, D., Guichet, C., Boudet, N., Thomas, O.

Journal:

Materials Letters

Year:

2014

Language:

english

File:

PDF, 2.59 MB

english, 2014

116

Progress in the understanding of Ni silicide formation for advanced MOS structures

Mangelinck, D., Hoummada, K., Panciera, F., El Kousseifi, M., Blum, I., Descoins, M., Bertoglio, M., Portavoce, A., Perrin, C., Putero, M.

Journal:

physica status solidi (a)

Year:

2014

Language:

english

File:

PDF, 836 KB

english, 2014

117

Atom probe tomography of secondary γ′ precipitation in a single crystal Ni-based superalloy after isothermal aging at 1100°C

Tan, X.P., Mangelinck, D., Perrin-Pellegrino, C., Rougier, L., Gandin, Ch.-A., Jacot, A., Ponsen, D., Jaquet, V.

Journal:

Journal of Alloys and Compounds

Year:

2014

Language:

english

File:

PDF, 804 KB

english, 2014

118

Columnar-to-Equiaxed Transition in Solidification Processing of AlSi7 Alloys in Microgravity the CETSOL Project

Zimmermann, Gerhard, Sturz, L., Billia, B., Mangelinck-Noël, N., Liu, D.R., Nguyen Thi, H., Bergeon, N., Gandin, C.A., Browne, D.J., Beckermann, C., Tourret, D., Karma, A.

Journal:

Materials Science Forum

Year:

2014

Language:

english

File:

PDF, 1.74 MB

english, 2014

119

Kinetics of growth and consumption of Ni rich phases

Tellouche-Derafa, G., Hoummada, K., Derafa, A., Blum, I., Portavoce, A., Mangelinck, D.

Journal:

Microelectronic Engineering

Year:

2014

Language:

english

File:

PDF, 1.16 MB

english, 2014

120

Ni silicide nanowires analysis by atom probe tomography

El Kousseifi, M., Panciera, F., Hoummada, K., Descoins, M., Baron, T., Mangelinck, D.

Journal:

Microelectronic Engineering

Year:

2014

Language:

english

File:

PDF, 2.21 MB

english, 2014

121

Subnanometric Si film reactive diffusion on Ni

Portavoce, A., Lalmi, B., Tréglia, G., Girardeaux, C., Mangelinck, D., Aufray, B., Bernardini, J.

Journal:

Applied Physics Letters

Year:

2009

Language:

english

File:

PDF, 460 KB

english, 2009

122

Kinetic of Formation of Ni and Pd Silicides: Determination of Interfacial Mobility and Interdiffusion Coefficient by In Situ Techniques

Hoummada, Khalid, Mangelinck, Dominique, Portavoce, Alain

Journal:

Solid State Phenomena

Year:

2011

Language:

english

File:

PDF, 329 KB

english, 2011

123

Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films

Portavoce, Alain, Blum, Ivan, Chow, Lee, Bernardini, Jean, Mangelinck, Dominique

Journal:

Defect and Diffusion Forum

Year:

2011

Language:

english

File:

PDF, 858 KB

english, 2011

124

Theoretical and Experimental Evidences of Sequential Phase Formation during Sub-Nanometric-Thick Film Reactive Diffusion

Portavoce, Alain, Tréglia, Guy, Lalmi, Boubekeur, Girardeaux, Christophe, Mangelinck, Dominique, Aufray, Bernard, Bernardini, Jean

Journal:

Solid State Phenomena

Year:

2011

Language:

english

File:

PDF, 512 KB

english, 2011

125

Spinodal Decomposition Mechanism of γ′ Precipitation in a Single Crystal Ni-Based Superalloy

X.P. Tan,D. Mangelinck,C. Perrin-Pellegrino…

Journal:

Metallurgical and Materials Transactions A

Year:

2014

Language:

english

File:

PDF, 1.13 MB

english, 2014

126

Variation of microstructure by Ru additions in a single crystal Ni based superalloy

Tan, X. P., Liu, J. L., Jin, T., Hu, Z. Q., Hong, H. U., Choi, B. G., Kim, I. S., Jo, C. Y., Mangelinck, D.

Journal:

Materials Science and Technology

Year:

2014

Language:

english

File:

PDF, 1.04 MB

english, 2014

127

Solid solubility of As in CoSi[sub 2] and redistribution at the CoSi[sub 2]/Si interface

Mangelinck, D., Cardenas, J., d’Heurle, F. M., Svensson, B. G., Gas, P.

Journal:

Journal of Applied Physics

Year:

1999

Language:

english

File:

PDF, 287 KB

english, 1999

128

The feasibility of Al-based oxide precipitation in Fe–10%Cr alloy by ion implantation

Zheng, Ce, Gentils, Aurélie, Ribis, Joël, Kaïtasov, Odile, Borodin, Vladimir A., Descoins, Marion, Mangelinck, Dominique

Journal:

Philosophical Magazine

Year:

2014

Language:

english

File:

PDF, 764 KB

english, 2014

129

Static and dynamical ageing processes at room temperature in a Fe25Ni0.4C virgin martensite: effect of C redistribution at the nanoscale

Allain, Sébastien, Danoix, Frédéric, Goune, Mohamed, Hoummada, Khalid, Mangelinck, Dominique

Journal:

Philosophical Magazine Letters

Year:

2013

Language:

english

File:

PDF, 985 KB

english, 2013

130

Improved NiSi salicide process using presilicide N/sub 2//sup +/ implant for MOSFETs

Lee, P.S., Pey, K.L., Mangelinck, D., Ding, J., Wee, A.T.S., Chan, L.

Journal:

IEEE Electron Device Letters

Year:

2000

Language:

english

File:

PDF, 56 KB

english, 2000

131

Effects of the Interface Curvature and Dendrite Orientation in Directional Solidification of Bulk Transparent Alloys

Weiss, Cedric, Bergeon, Nathalie, Mangelinck-Noël, Nathalie, Billia, Bernard

Journal:

Materials Science Forum

Year:

2006

Language:

english

File:

PDF, 3.56 MB

english, 2006

132

[IEEE European Workshop Materials for Advanced Metallization. MAM'97 Abstracts Booklet - Villard de Lans, France (1997.03.16-1997.03.19)] European Workshop Materials for Advanced Metallization, - Arsenic solubility in single crystalline cobalt disilicide

Mangelinck, D., Cardenas, J., Svensson, B.G.

Year:

1998

Language:

english

File:

PDF, 96 KB

english, 1998

133

Effect of Co, Pt, and Au additions on the stability and epitaxy of NiSi[sub 2] films on (111)Si

D. Mangelinck, P. Gas, J. M. Gay, B. Pichaud, O. Thomas

Year:

1998

Language:

english

File:

PDF, 505 KB

english, 1998

134

Anisotropy of the thermal expansion of the Ni(Si[sub 1−x]Ge[sub x]) phases investigated by high-temperature x-ray diffraction

Perrin, C., Nemouchi, F., Clugnet, G., Mangelinck, D.

Journal:

Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 554 KB

english, 2007

135

Publisher's Note: In situ and real-time probing of quasicrystal solidification dynamics by synchrotron imaging [Phys. Rev. E 74 , 031605 (2006)]

Nguyen Thi, H., Gastaldi, J., Schenk, T., Reinhart, G., Mangelinck-Noel, N., Cristiglio, V., Billia, B., Grushko, B., Härtwig, J., Klein, H., Baruchel, J.

Journal:

Physical Review E

Year:

2006

File:

PDF, 22 KB

2006

136

B diffusion in implanted Ni[sub 2]Si and NiSi layers

I. Blum, A. Portavoce, L. Chow, D. Mangelinck, K. Hoummada, G. Tellouche, V. Carron

Year:

2010

Language:

english

File:

PDF, 500 KB

english, 2010

137

Thermoelectric magnetic flows in melt during directional solidification

Wang, J., Nguyen-Thi, H., Salloum Abou Jaoude, G., Reinhart, G., Mangelinck-Noël, N., Kaldre, I., Ren, Z. M., Li, X.

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 2.11 MB

english, 2014

138

Increased nucleation temperature of NiSi[sub 2] in the reaction of Ni thin films with Si[sub 1−x]Ge[sub x]

Seger, J., Zhang, S.-L., Mangelinck, D., Radamson, H. H.

Journal:

Applied Physics Letters

Year:

2002

Language:

english

File:

PDF, 314 KB

english, 2002

139

Influence of the addition of Co and Ni on the formation of epitaxial semiconducting β-FeSi[sub 2]: Comparison of different evaporation methods

Mangelinck, D., Wang, L., Lin, C., Gas, P., Grahn, J., Östling, M.

Journal:

Journal of Applied Physics

Year:

1998

Language:

english

File:

PDF, 910 KB

english, 1998

140

Nickel-platinum alloy monosilicidation-induced defects in n-type silicon

Chi, D. Z., Mangelinck, D., Dai, J. Y., Lahiri, S. K., Pey, K. L., Ho, C. S.

Journal:

Applied Physics Letters

Year:

2000

Language:

english

File:

PDF, 443 KB

english, 2000

141

Differential scanning calorimetry analysis of the linear parabolic growth of nanometric Ni silicide thin films on a Si substrate

Nemouchi, F., Mangelinck, D., Bergman, C., Gas, P., Smith, Ulf

Journal:

Applied Physics Letters

Year:

2005

Language:

english

File:

PDF, 333 KB

english, 2005

142

Formation of Ni silicide from Ni(Au) films on (111)Si

Mangelinck, D., Gas, P., Grob, A., Pichaud, B., Thomas, O.

Journal:

Journal of Applied Physics

Year:

1996

Language:

english

File:

PDF, 852 KB

english, 1996

143

Kinetics of a transient silicide during the reaction of Ni thin film with (100)Si

D. Mangelinck, K. Hoummada, I. Blum

Year:

2009

Language:

english

File:

PDF, 585 KB

english, 2009

144

Simultaneous growth of Ni[sub 5]Ge[sub 3] and NiGe by reaction of Ni film with Ge

Nemouchi, F., Mangelinck, D., Bergman, C., Clugnet, G., Gas, P., Lábár, J. L.

Journal:

Applied Physics Letters

Year:

2006

Language:

english

File:

PDF, 317 KB

english, 2006

145

Coexistence of hexagonal and orthorhombic structures in NiSi films containing Pt

Dai, J. Y., Mangelinck, D., Lahiri, S. K.

Journal:

Applied Physics Letters

Year:

1999

Language:

english

File:

PDF, 676 KB

english, 1999

146

First stages of the formation of Ni silicide by atom probe tomography

Hoummada, K., Cadel, E., Mangelinck, D., Perrin-Pellegrino, C., Blavette, D., Deconihout, B.

Journal:

Applied Physics Letters

Year:

2006

Language:

english

File:

PDF, 627 KB

english, 2006

147

Enhancement of thermal stability of NiSi films on (100)Si and (111)Si by Pt addition

Mangelinck, D., Dai, J. Y., Pan, J. S., Lahiri, S. K.

Journal:

Applied Physics Letters

Year:

1999

Language:

english

File:

PDF, 406 KB

english, 1999

148

Composition measurement of the Ni-silicide transient phase by atom probe tomography

Hoummada, K., Blum, I., Mangelinck, D., Portavoce, A.

Journal:

Applied Physics Letters

Year:

2010

Language:

english

File:

PDF, 931 KB

english, 2010

149

Effect of stress on the transformation of Ni[sub 2]Si into NiSi

Mangelinck, Dominique, Hoummada, Khalid

Journal:

Applied Physics Letters

Year:

2008

Language:

english

File:

PDF, 414 KB

english, 2008

150

Effect of Pd on the Ni2Si stress relaxation during the Ni-silicide formation at low temperature

Putero, M., Mangelinck, D.

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 1.66 MB

english, 2012