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51

[IEEE 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Moscow, Russia (2015.9.14-2015.9.18)] 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - The Issue of Using Test Dose Rate 10 mrad(Si)/s for ELDRS Prediction in MIL-STD-883-H

Yastrebov, Alexander T., Pershenkov, Viacheslav S., Bakerenkov, Alexander S., Felitsyn, Vladislav A., Rodin, Alexander S., Belyakov, Vladimir V., Shurenkov, Vladimir V.

Year:

2015

Language:

english

File:

PDF, 237 KB

english, 2015

52

[IEEE 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Moscow, Russia (2015.9.14-2015.9.18)] 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Evaluation of the Post-Irradiation Temperature Dependence of Operational Amplifier Input Bias Current

Rodin, Alexander S., Bakerenkov, Alexander S., Pershenkov, Viacheslav S., Felitsyn, Vladislav A., Miroshnichenko, Alina G., Glukhov, Nikita S.

Year:

2015

Language:

english

File:

PDF, 168 KB

english, 2015

53

System for Synchronous Detection Trace of Explosives and Drags Substances on Human Fingers

Samotaev, N., Vasilyev, V., Malkin, E., Gromov, E., Belyakov, V., Golovin, A., Pershenkov, V., Ivanov, I., Shaltaeva, Y., Matusko, M.

Journal:

Procedia Engineering

Year:

2015

Language:

english

File:

PDF, 679 KB

english, 2015

54

Effect of emitter-base bias during pre-irradiation infrared illumination on the radiation response of bipolar transistors

Pershenkov, V.S., Bashin, A.Y., Zebrev, G.I., Avdeev, S.V., Belyakov, V.V., Ulimov, V.N., Emelianov, V.V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2002

Language:

english

File:

PDF, 293 KB

english, 2002

55

[IEEE 1997 21st International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 Sept. 1997)] 1997 21st International Conference on Microelectronics. Proceedings - Investigation of MOSFET operation in bipolar mode

Pershenkov, V.S., Belyakov, V.V., Cherepko, S.V., Shvetzov-Shilovsky, I.N., Abramov, V.V.

Year:

1997

Language:

english

File:

PDF, 322 KB

english, 1997

56

[IEEE 2000 22nd International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 May 2000)] 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) - The X-ray and UV controlled adjustment of MOSFET threshold voltage

Levin, M.N., Kadmensky, S.G., Pershenkov, V.S.

Year:

1999

Language:

english

File:

PDF, 284 KB

english, 1999

57

ELDRS in SiGe transistors for room and low-temperature irradiation

Pershenkov, V.S., Bakerenkov, A.S., Felitsyn, V.A., Rodin, A.S., Telets, V.A., Belyakov, V.V.

Journal:

Microelectronics Reliability

Year:

2016

Language:

english

File:

PDF, 647 KB

english, 2016

58

Electric Modeling of Charged Particles Trajectories in the Drift Tube of Ion Mobility Spectrometer for Hazardous Industrial Chemicals Detection

Samotaev, Nikolay, Pershenkov, Vecheslav, Belyakov, Vladimir, Vasilyev, Valeriy, Golovin, Anatoliy, Ivanov, Igor, Malkin, Evgeniy, Gromov, Evgeniy

Journal:

Procedia Engineering

Year:

2014

Language:

english

File:

PDF, 1003 KB

english, 2014

59

SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Radiation induced leakage due to stochastic charge trapping in isolation layers of nanoscale MOSFETs

Zebrev, G. I., Gorbunov, M. S., Pershenkov, V. S., Valiev, Kamil A., Orlikovsky, Alexander A.

Year:

2012

Language:

english

File:

PDF, 203 KB

english, 2012

60

ELDRS Susceptibility of Bipolar Transistors and Integrated Circuits During Low Temperature Irradiation

Bakerenkov, Alexander, Pershenkov, Viacheslav, Felitsyn, Vladislav, Rodin, Alexander, Telets, Vitaly, Belyakov, Vladimir, Shurenkov, Vladimir

Journal:

IEEE Transactions on Nuclear Science

Year:

2017

Language:

english

File:

PDF, 1.54 MB

english, 2017

61

1st International Telecommunication Conference “Advanced Micro- and Nanoelectronic Systems and Technologies”

Pershenkov, V S, Zebrev, G I

Journal:

IOP Conference Series Materials Science and Engineering

Year:

2016

Language:

english

File:

PDF, 244 KB

english, 2016

62

True dose rate physical mechanism of ELDRS effect in bipolar devices

Pershenkov, V.S., Petrov, A.S., Bakerenkov, A.S., Ulimov, V.N., Felytsyn, V.A., Rodin, A.S., Belyakov, V.V., Telets, V.A., Shurenkov, V.V.

Journal:

Microelectronics Reliability

Year:

2017

Language:

english

File:

PDF, 1000 KB

english, 2017

63

Conversion model of radiation-induced interface-trap buildup and the some examples of its application

Pershenkov, V S, Sogoyan, A V, Telets, V A

Journal:

IOP Conference Series Materials Science and Engineering

Year:

2016

Language:

english

File:

PDF, 1.08 MB

english, 2016

64

[IEEE 2017 IEEE Nuclear & Space Radiation Effects Conference (NSREC): Radiation Effects Data Workshop (REDW) - New Orleans, LA (2017.7.17-2017.7.21)] 2017 IEEE Radiation Effects Data Workshop (REDW) - The Impact of Annealing on the Following Radiation Degradation Rate of Bipolar Devices

Bakerenkov, Alexander S., Rodin, Alexander S., Pershenkov, Viacheslav S., Felitsyn, Vladislav A., Bursian, Yury D.

Year:

2017

Language:

english

File:

PDF, 244 KB

english, 2017

65

[IEEE 2017 IEEE 30th International Conference on Microelectronics (MIEL) - Nis (2017.10.9-2017.10.11)] 2017 IEEE 30th International Conference on Microelectronics (MIEL) - Joint model of dose rate radiation effects in bipolar devices

Pershenkov, V., Bakerenkov, A., Telets, V., Belyakov, V., Shurenkov, V., Felitsyn, V., Rodin, A.

Year:

2017

Language:

english

File:

PDF, 643 KB

english, 2017

66

ELDRS in a wide range of total doses

Pershenkov, V S, Savchenkov, D V, Telets, V A

Journal:

IOP Conference Series Materials Science and Engineering

Year:

2016

Language:

english

File:

PDF, 1.19 MB

english, 2016

67

[IEEE 2017 IEEE Workshop on Environmental, Energy, and Structural Monitoring Systems (EESMS) - Milan, Italy (2017.7.24-2017.7.25)] 2017 IEEE Workshop on Environmental, Energy, and Structural Monitoring Systems (EESMS) - Microwave dosimeters for domestic use

Simakov, A., Onishchenko, E., Gurkovskiy, B., Butuzov, V., Bocharov, Yu., Vodokhlebov, I., Pershenkov, V., Zhuravlev, B., Trifonova, N.

Year:

2017

Language:

english

File:

PDF, 1.64 MB

english, 2017

68

[IEEE 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) - Waikoloa, HI, USA (2018.7.16-2018.7.20)] 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) - TID Response of AD590 Temperature Sensor in Wide Operation Temperature Range

Bakerenkov, Alexander S., Felitsyn, Vladislav A., Rodin, Alexander S., Pershenkov, Viacheslav S., Koziukov, Aleksandr E., Podlepetsky, Boris I., Belyakov, Vladimir V., Petkovich, Evgeny V.

Year:

2018

Language:

english

File:

PDF, 971 KB

english, 2018

69

Effect of Temperature and Electrical Modes on Radiation Sensitivity of MISFET Dose Sensors

Podlepetsky, Boris, Pershenkov, Viacheslav, Bakerenkov, Alexander, Felitsyn, Vladislav, Rodin, Alexander

Journal:

Proceedings (American Bar Association. Section of International and Comparative Law)

Year:

2018

Language:

english

File:

PDF, 616 KB

english, 2018

70

[IEEE 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Geneva, Switzerland (2017.10.2-2017.10.6)] 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Temperature dependence of the radiation degradation at high total dose levels

Pershenkov, Viacheslav S., Bakerenkov, Alexander S., Telets, Vitaly A., Belyakov, Vladimir V., Shurenkov, Vladimir V., Felitsyn, Vladislav A., Rodin, Alexander S.

Year:

2017

Language:

english

File:

PDF, 251 KB

english, 2017

71

Low temperature radiation response of SiGe HBTs

Bakerenkov, A S, Felitsyn, V A, Rodin, A S, Bursian, Yu D, Pershenkov, V S

Journal:

IOP Conference Series Materials Science and Engineering

Year:

2019

Language:

english

File:

PDF, 582 KB

english, 2019

72

[IEEE 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Geneva, Switzerland (2017.10.2-2017.10.6)] 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Estimation of the Radiation Hardness of Bipolar Voltage Comparators in Wide Operation Temperature Range

Bakerenkov, Alexander S., Rodin, Alexander S., Felitsyn, Vladislav A., Pershenkov, Viacheslav S., Butin, Valentin I.

Year:

2017

Language:

english

File:

PDF, 164 KB

english, 2017

73

[IEEE 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Nis, Serbia (2019.9.16-2019.9.18)] 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Reduced Low Dose Rate Sensitivity (RLDRS) in Bipolar Devices

Pershenkov, V., Bakerenkov, A., Rodin, A., Felitsyn, V., Telets, V., Belyakov, V.

Year:

2019

Language:

english

File:

PDF, 524 KB

english, 2019

74

[IEEE 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Nis, Serbia (2019.9.16-2019.9.18)] 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Fast Switching of the Polarity of Dual Mode Ion Mobility Spectrometer

Pershenkov, V., Belyakov, V., Shaltaeva, Y., Malkin, E., Golovin, A., Ivanov, I., Vasilyev, V., Matusko, M., Gromov, E.

Year:

2019

Language:

english

File:

PDF, 640 KB

english, 2019

75

[IEEE 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Nis, Serbia (2019.9.16-2019.9.18)] 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Experimental Estimation of Input Offset Voltage Radiation Degradation Rate in Bipolar Operational Amplifiers

Bakerenkov, A., Pershenkov, V., Felitsyn, V., Rodin, A., Telets, V., Belyakov, V., Zhukov, A., Gluhov, N.

Year:

2019

Language:

english

File:

PDF, 745 KB

english, 2019

76

[IEEE 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Nis, Serbia (2019.9.16-2019.9.18)] 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Dual Mode Ion Mobility Spectrometer High Voltage Formation Circuit

Gromov, E., Matusko, M., Shaltaeva, Y., Pershenkov, V., Belyakov, V., Golovin, A., Malkin, E., Ivanov, I., Vasilyev, V.

Year:

2019

Language:

english

File:

PDF, 918 KB

english, 2019

77

[IEEE 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Nis, Serbia (2019.9.16-2019.9.18)] 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Correlation between Temperature and Dose Rate Dependences of Input Bias Current Degradation in Bipolar Operational Amplifiers

Bakerenkov, A., Pershenkov, V., Felitsyn, V., Rodin, A., Telets, V., Belyakov, V., Zhukov, A., Gluhov, N.

Year:

2019

Language:

english

File:

PDF, 564 KB

english, 2019

78

[IEEE 2019 IEEE Radiation Effects Data Workshop (IEEE) (in conjunction with NSREC 2019) - San Antonio, TX, USA (2019.7.8-2019.7.12)] 2019 IEEE Radiation Effects Data Workshop - Radiation Degradation of Temperature Dependences of Electrical Parameters of Bipolar Operational Amplifiers

Bakerenkov, Alexander S., Pershenkov, Viacheslav S., Felitsyn, Vladislav A., Rodin, Alexander S., Telets, Vitaly A., Belyakov, Vladimir V., Zhukov, Alexander I., Gluhov, Nikita S.

Year:

2019

Language:

english

File:

PDF, 119 KB

english, 2019

79

Radiation hardness estimation in various temperature conditions under radiation impact

Bakerenkov, A S, Rodin, A S, Felitsyn, V A, Pershenkov, V S

Journal:

IOP Conference Series Materials Science and Engineering

Year:

2019

File:

PDF, 759 KB

2019

80

Application of the ion mixing method for doping near surface layers of the silicon single crystals

Volkov, N, Kalin, B, Voronov, Yu, Pershenkov, V

Journal:

IOP Conference Series Materials Science and Engineering

Year:

2019

File:

PDF, 444 KB

2019

81

Exhaled breath mass spectrometry in heart failure diagnostics

Malinovskaya, Liudmila, Bykova, Alexandra, Chomakhidze, Peter, Kopylov, Filip, Syrkin, Abram, Patrikeev, Lev, Vasilev, Valery, Belyakov, Vladimir, Golovin, Anatoly, Pershenkov, Vyacheslav, Malkin, Eug

Journal:

International Journal of Nanotechnology

Year:

2019

File:

PDF, 1.46 MB

2019