101

High-Resolution Scanning Surface-Plasmon Microscopy

Year:
2000
Language:
english
File:
PDF, 1.41 MB
english, 2000
103

Use of artificial neural networks on optical track width measurements

Year:
2007
Language:
english
File:
PDF, 1.24 MB
english, 2007
106

Focus errors and their correction in microscopic deformation analysis using correlation

Year:
2002
Language:
english
File:
PDF, 1.06 MB
english, 2002