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51

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Programmable deterministic Built-In Self-Test

Hakmi, Abdul-Wahid, Wunderlich, Hans-Joachim, Zoellin, Christian G., Glowatz, Andreas, Hapke, Friedrich

Year:

2007

Language:

english

File:

PDF, 998 KB

english, 2007

52

[IEEE 2012 13th Latin American Test Workshop - LATW - Quito, Ecuador (2012.04.10-2012.04.13)] 2012 13th Latin American Test Workshop (LATW) - Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test

Cook, Alejandro, Hellebrand, Sybille, Imhof, Michael E., Mumtaz, Abdullah, Wunderlich, Hans-Joachim

Year:

2012

Language:

english

File:

PDF, 339 KB

english, 2012

53

Structure of Reduced DsbA from Escherichia coli in Solution †,‡

Schirra, Horst Joachim, Renner, Christian, Czisch, Michael, Huber-Wunderlich, Martina, Holak, Tad A., Glockshuber, Rudi

Journal:

Year:

1998

Language:

english

File:

PDF, 284 KB

english, 1998

54

Thermotropic lipid clustering in tetrahymena membranes

Wunderlich, Frank, Ronai, Adam, Speth, Volker, Seelig, Joachim, Blume, Alfred

Journal:

Year:

1975

Language:

english

File:

PDF, 1.47 MB

english, 1975

55

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Bit-Flipping Scan - A unified architecture for fault tolerance and offline test

Imhof, Michael E., Wunderlich, Hans-Joachim

Year:

2014

Language:

english

File:

PDF, 803 KB

english, 2014

56

[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - Module diversification: Fault tolerance and aging mitigation for runtime reconfigurable architectures

Zhang, Hongyan, Bauer, Lars, Kochte, Michael A., Schneider, Eric, Braun, Claus, Imhof, Michael E., Wunderlich, Hans-Joachim, Henkel, Jorg

Year:

2013

Language:

english

File:

PDF, 785 KB

english, 2013

57

[IEEE 12th IEEE European Test Symposium - Freiburg, Germany (2007.05.20-2007.05.24)] 12th IEEE European Test Symposium (ETS'07) - An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy

Ohler, Philipp, Hellebrand, Sybille, Wunderlich, Hans-Joachim

Year:

2007

Language:

english

File:

PDF, 709 KB

english, 2007

58

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Efficient system-level aging prediction

Hatami, Nadereh, Baranowski, Rafal, Prinetto, Paolo, Wunderlich, Hans-Joachim

Year:

2012

Language:

english

File:

PDF, 815 KB

english, 2012

59

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Restrict Encoding for Mixed-Mode BIST

Hakmi, Abdul-Wahid, Holst, Stefan, Wunderlich, Hans-Joachim, Schlöffel, Jürgen, Hapke, Friedrich, Glowatz, Andreas

Year:

2009

Language:

english

File:

PDF, 717 KB

english, 2009

60

[IEEE 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems - Krakow, Poland (2007.04.11-2007.04.13)] 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems - Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair

Ohler, Philipp, Hellebrand, Sybille, Wunderlich, Hans-Joachim

Year:

2007

Language:

english

File:

PDF, 419 KB

english, 2007

61

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Variation-Aware Fault Modeling

Hopsch, Fabian, Becker, Bernd, Hellebrand, Sybille, Polian, Ilia, Straube, Bernd, Vermeiren, Wolfgang, Wunderlich, Hans-Joachim

Year:

2010

Language:

english

File:

PDF, 369 KB

english, 2010

62

[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - P-PET: Partial pseudo-exhaustive test for high defect coverage

Mumtaz, Abdullah, Imhof, Michael E., Wunderlich, Hans-Joachim

Year:

2011

Language:

english

File:

PDF, 793 KB

english, 2011

63

[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Scan pattern retargeting and merging with reduced access time

Baranowski, Rafal, Kochte, Michael A., Wunderlich, Hans-Joachim

Year:

2013

Language:

english

File:

PDF, 1.12 MB

english, 2013

64

[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Area-efficient synthesis of fault-secure NoC switches

Dalirsani, Atefe, Kochte, Michael A., Wunderlich, Hans-Joachim

Year:

2014

Language:

english

File:

PDF, 186 KB

english, 2014

65

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Efficient BDD-based Fault Simulation in Presence of Unknown Values

Kochte, Michael A., Kundu, Sandip, Miyase, Kohei, Wen, Xiaoqing, Wunderlich, Hans-Joachim

Year:

2011

Language:

english

File:

PDF, 196 KB

english, 2011

66

[IEEE 12th IEEE European Test Symposium - Freiburg, Germany (2007.05.20-2007.05.24)] 12th IEEE European Test Symposium (ETS'07) - Adaptive Debug and Diagnosis without Fault Dictionaries

Holst, Stefan, Wunderlich, Hans-Joachim

Year:

2007

Language:

english

File:

PDF, 242 KB

english, 2007

67

[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Synthesis of workload monitors for on-line stress prediction

Baranowski, Rafal, Cook, Alejandro, Imhof, Michael E., Liu, Chang, Wunderlich, Hans-Joachim

Year:

2013

Language:

english

File:

PDF, 805 KB

english, 2013

68

[IEEE 2012 IEEE International Conference on Bioinformatics and Biomedicine (BIBM) - Philadelphia, PA, USA (2012.10.4-2012.10.7)] 2012 IEEE International Conference on Bioinformatics and Biomedicine - Parallel simulation of apoptotic receptor-clustering on GPGPU many-core architectures

Braun, Claus, Daub, Markus, Scholl, Alexander, Schneider, Guido, Wunderlich, Hans-Joachim

Year:

2012

Language:

english

File:

PDF, 2.25 MB

english, 2012

69

[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - Signature Rollback - A Technique for Testing Robust Circuits

Amgalan, Uranmandakh, Hachmann, Christian, Hellebrand, Sybille, Wunderlich, Hans-Joachim

Year:

2008

Language:

english

File:

PDF, 911 KB

english, 2008

70

[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - Diagnosis of multiple faults with highly compacted test responses

Cook, Alejandro, Wunderlich, Hans-Joachim

Year:

2014

Language:

english

File:

PDF, 285 KB

english, 2014

71

[IEEE 2013 22nd Asian Test Symposium (ATS) - Yilan County, Taiwan (2013.11.18-2013.11.21)] 2013 22nd Asian Test Symposium - Accurate Multi-cycle ATPG in Presence of X-Values

Erb, Dominik, Kochte, Michael A., Sauer, Matthias, Wunderlich, Hans-Joachim, Becker, Bernd

Year:

2013

Language:

english

File:

PDF, 465 KB

english, 2013

72

[IEEE 2010 15th IEEE European Test Symposium (ETS 2010) - Praha (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - Algorithm-based fault tolerance for many-core architectures

Braun, Claus, Wunderlich, Hans-Joachim

Year:

2010

Language:

english

File:

PDF, 181 KB

english, 2010

73

[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Structural Software-Based Self-Test of Network-on-Chip

Dalirsani, Atefe, Imhof, Michael E., Wunderlich, Hans-Joachim

Year:

2014

Language:

english

File:

PDF, 1.11 MB

english, 2014

74

[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs

Cook, Alejandro, Ull, Dominik, Elm, Melanie, Wunderlich, Hans-Joachim, Randoll, Helmut, Dohren, Stefan

Year:

2012

Language:

english

File:

PDF, 292 KB

english, 2012

75

[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - SAT-based code synthesis for fault-secure circuits

Dalirsani, Atefe, Kochte, Michael A., Wunderlich, Hans-Joachim

Year:

2013

Language:

english

File:

PDF, 807 KB

english, 2013

76

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - BIST Power Reduction Using Scan-Chain Disable in the Cell Processor

Zoellin, Christian, Wunderlich, Hans-joachim, Maeding, Nicolas, Leenstra, Jens

Year:

2006

Language:

english

File:

PDF, 506 KB

english, 2006

77

[IEEE 2013 22nd Asian Test Symposium (ATS) - Yilan County, Taiwan (2013.11.18-2013.11.21)] 2013 22nd Asian Test Symposium - Securing Access to Reconfigurable Scan Networks

Baranowski, Rafal, Kochte, Michael A., Wunderlich, Hans-Joachim

Year:

2013

Language:

english

File:

PDF, 456 KB

english, 2013

78

[IEEE 2012 NASA/ESA Conference on Adaptive Hardware and Systems (AHS) - Erlangen, Germany (2012.06.25-2012.06.28)] 2012 NASA/ESA Conference on Adaptive Hardware and Systems (AHS) - OTERA: Online test strategies for reliable reconfigurable architectures — Invited paper for the AHS-2012 special session “Dependability by reconfigurable hardware”

Bauer, Lars, Braun, Claus, Imhof, Michael E., Kochte, Michael A., Zhang, Hongyan, Wunderlich, Hans-Joachim, Henkel, Jorg

Year:

2012

Language:

english

File:

PDF, 953 KB

english, 2012

79

Powershift transmissions for city buses

Dr.-Ing. Joachim Foth,Dr.-Ing. Peter Wunderlich…

Journal:

ATZ worldwide eMagazine

Year:

2010

Language:

english

File:

PDF, 362 KB

english, 2010

80

Lastschaltgetriebe für Stadtbusse

Dr.-Ing. Joachim Foth,Dipl.-Ing. Peter Wunderlich…

Journal:

ATZ - Automobiltechnische Zeitschrift

Year:

2010

Language:

german

File:

PDF, 802 KB

german, 2010

81

[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Scan Chain Organization for Embedded Diagnosis

Elm, Melanie, Wunderlich, Hans-Joachim

Year:

2008

Language:

english

File:

PDF, 203 KB

english, 2008

82

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Bit-Flipping Scan - A unified architecture for fault tolerance and offline test

Imhof, Michael E., Wunderlich, Hans-Joachim

Year:

2014

Language:

english

File:

PDF, 803 KB

english, 2014

83

[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - Variation-aware deterministic ATPG

Sauer, Matthias, Polian, Ilia, Imhof, Michael E., Mumtaz, Abdullah, Schneider, Eric, Czutro, Alexander, Wunderlich, Hans-Joachim, Becker, Bernd

Year:

2014

Language:

english

File:

PDF, 379 KB

english, 2014

84

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - On Determining the Real Output Xs by SAT-Based Reasoning

Elm, Melanie, Kochte, Michael A., Wunderlich, Hans-Joachim

Year:

2010

Language:

english

File:

PDF, 339 KB

english, 2010

85

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Structural In-Field Diagnosis for Random Logic Circuits

Cook, Alejandro, Elm, Melanie, Wunderlich, Hans-Joachim, Abelein, Ulrich

Year:

2011

Language:

english

File:

PDF, 315 KB

english, 2011

86

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Diagnostic Test of Robust Circuits

Cook, Alejandro, Hellebrand, Sybille, Indlekofer, Thomas, Wunderlich, Hans-Joachim

Year:

2011

Language:

english

File:

PDF, 401 KB

english, 2011

87

[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Efficient Variation-Aware Statistical Dynamic Timing Analysis for Delay Test Applications

Wagner, Marcus, Wunderlich, Hans-Joachim

Year:

2013

Language:

english

File:

PDF, 302 KB

english, 2013

88

[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - Scan Test Power Simulation on GPGPUs

Holst, Stefan, Schneider, Eric, Wunderlich, Hans-Joachim

Year:

2012

Language:

english

File:

PDF, 209 KB

english, 2012

89

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Modeling, verification and pattern generation for reconfigurable scan networks

Baranowski, Rafal, Kochte, Michael A., Wunderlich, Hans-Joachim

Year:

2012

Language:

english

File:

PDF, 1.16 MB

english, 2012

90

[IEEE 2014 44th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) - Atlanta, GA, USA (2014.6.23-2014.6.26)] 2014 44th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - A-ABFT: Autonomous Algorithm-Based Fault Tolerance for Matrix Multiplications on Graphics Processing Units

Braun, Claus, Halder, Sebastian, Wunderlich, Hans Joachim

Year:

2014

Language:

english

File:

PDF, 664 KB

english, 2014

91

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - System reliability evaluation using concurrent multi-level simulation of structural faults

Kochte, Michael A., Zoellin, Christian G., Baranowski, Rafal, Imhof, Michael E., Wunderlich, Hans-Joachim, Hatami, Nadereh, Di Carlo, Stefano, Prinetto, Paolo

Year:

2010

Language:

english

File:

PDF, 65 KB

english, 2010

92

[ACM Press the The 51st Annual Design Automation Conference - San Francisco, CA, USA (2014.06.01-2014.06.05)] Proceedings of the The 51st Annual Design Automation Conference on Design Automation Conference - DAC '14 - Advanced Diagnosis

Reimann, Felix, Glaß, Michael, Teich, Jürgen, Cook, Alejandro, Gómez, Laura Rodríguez, Ull, Dominik, Wunderlich, Hans-Joachim, Engelke, Piet, Abelein, Ulrich

Year:

2014

Language:

english

File:

PDF, 488 KB

english, 2014

93

Initial clinical experience with the Coherex FlatStent™ and FlatStent™ EF PFO closure system for in-tunnel PFO closure: Results of the Coherex-EU study

Sievert, Horst, Wunderlich, Nina, Reiffenstein, Isabel, Ruygrok, Peter, Grube, Eberhard, Buellesfeld, Lutz, Meier, Bernhard, Schofer, Joachim, Muller, David, Jones, Randall K., Gillam, Linda

Journal:

Catheterization and Cardiovascular Interventions

Year:

2014

Language:

english

File:

PDF, 877 KB

english, 2014

94

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Soft error correction in embedded storage elements

Imhof, Michael E., Wunderlich, Hans-Joachim

Year:

2011

Language:

english

File:

PDF, 262 KB

english, 2011

95

[IEEE 2009 14th IEEE European Test Symposium (ETS) - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - Test Encoding for Extreme Response Compaction

Kochte, Michael A., Holst, Stefan, Elm, Melanie, Wunderlich, Hans-Joachim

Year:

2009

Language:

english

File:

PDF, 201 KB

english, 2009

96

[IEEE 2008 13th IEEE European Test Symposium (ETS) - Verbania, italy (2008.05.25-2008.05.29)] 2008 13th European Test Symposium - Adaptive Debug and Diagnosis without Fault Dictionaries

Holst, Stefan, Wunderlich, Hans-Joachim

Year:

2008

Language:

english

File:

PDF, 273 KB

english, 2008

97

Exact Logic and Fault Simulation in Presence of Unknowns

Erb, Dominik, Kochte, Michael A., Sauer, Matthias, Hillebrecht, Stefan, Schubert, Tobias, Wunderlich, Hans-Joachim, Becker, Bernd

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2014

Language:

english

File:

PDF, 487 KB

english, 2014

98

[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - Incremental computation of delay fault detection probability for variation-aware test generation

Wagner, Marcus, Wunderlich, Hans-Joachim

Year:

2014

Language:

english

File:

PDF, 433 KB

english, 2014

99

[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Accurate QBF-based Test Pattern Generation in Presence of Unknown Values

Hillebrecht, Stefan, Kochte, Michael A., Erb, Dominik, Wunderlich, Hans-Joachim, Becker, Bernd

Year:

2013

Language:

english

File:

PDF, 665 KB

english, 2013

100

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Fail-safety in core-based system design

Baranowski, Rafal, Wunderlich, Hans-Joachim

Year:

2011

Language:

english

File:

PDF, 369 KB

english, 2011