Effect of successive implantation of Ag+(Cu+) and Xe+ions...

Semiconductors 1997 / 07 Vol. 31; Iss. 7

Effect of successive implantation of Ag+(Cu+) and Xe+ions on the recombination properties of CdxHg1−xTe crystals

M. I. Ibragimova, N. S. Baryshev, V. Yu. Petukhov, I. B. Khaibullin
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Volume:
31
Language:
english
Pages:
3
DOI:
10.1134/1.1187061
Date:
July, 1997
File:
PDF, 81 KB
english, 1997
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