Cross-sectional electrostatic force microscopy of...

Semiconductors 2001 / 07 Vol. 35; Iss. 7

Cross-sectional electrostatic force microscopy of semiconductor laser diodes

A. V. Ankudinov, E. Yu. Kotel’nikov, A. A. Kantsel’son, V. P. Evtikhiev, A. N. Titkov
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Volume:
35
Language:
english
Pages:
7
DOI:
10.1134/1.1385722
Date:
July, 2001
File:
PDF, 371 KB
english, 2001
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