X-ray photoelectron spectroscopy and X-ray...

Semiconductors 2003 / 06 Vol. 37; Iss. 6

X-ray photoelectron spectroscopy and X-ray electron-microprobe analysis of single crystals based on bismuth telluride

I. V. Gasenkova, V. A. Chubarenko, E. A. Tyavlovskaya, T. E. Svechnikova
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Volume:
37
Language:
english
Pages:
5
DOI:
10.1134/1.1582527
Date:
June, 2003
File:
PDF, 65 KB
english, 2003
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