Determination of the minority-carrier lifetime in silicon...

Semiconductors 2004 / 09 Vol. 38; Iss. 9

Determination of the minority-carrier lifetime in silicon ingots by photoconductivity relaxation measured at microwave frequencies

P. A. Borodovskii, A. F. Buldygin, A. S. Tokarev
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Volume:
38
Language:
english
Pages:
7
DOI:
10.1134/1.1797476
Date:
September, 2004
File:
PDF, 101 KB
english, 2004
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