CMOS logic elements with increased failure resistance to...

Russian Microelectronics 2011 / 05 Vol. 40; Iss. 3

CMOS logic elements with increased failure resistance to single-event upsets

S. I. Ol’chev, V. Ya. Stenin
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Volume:
40
Language:
english
Pages:
14
DOI:
10.1134/s106373971103005x
Date:
May, 2011
File:
PDF, 249 KB
english, 2011
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