Spectrometric properties of SiC detectors based on...

Semiconductors 2006 / 09 Vol. 40; Iss. 9

Spectrometric properties of SiC detectors based on ion-implantedp+-njunctions

E. V. Kalinina, V. G. Kossov, N. B. Strokan, A. M. Ivanov, R. R. Yafaev, G. F. Kholuyanov
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Volume:
40
Language:
english
Pages:
5
DOI:
10.1134/s1063782606090193
Date:
September, 2006
File:
PDF, 194 KB
english, 2006
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