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A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
D. Appello, A. Fudoli, V. Tancorre, P. Bernardi, F. Corno, M. Rebaudengo, M. Sonza ReordaVolume:
20
Language:
english
Pages:
9
DOI:
10.1023/b:jett.0000009315.57771.94
Date:
February, 2004
File:
PDF, 133 KB
english, 2004