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Volume 20; Issue 1
Main
Journal of Electronic Testing
Volume 20; Issue 1
Journal of Electronic Testing
Volume 20; Issue 1
1
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations
S.J. Spinks
,
C.D. Chalk
,
I.M. Bell
,
M. Zwolinski
Journal:
Journal of Electronic Testing
Year:
2004
Language:
english
File:
PDF, 201 KB
Your tags:
english, 2004
2
Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks
V. Stopjaková
,
P. Malošek
,
D. Mičušík
,
M. Matej
,
M. Margala
Journal:
Journal of Electronic Testing
Year:
2004
Language:
english
File:
PDF, 193 KB
Your tags:
english, 2004
3
Control and Observation Structure for Analog Circuits with Current Test Data
Chun-Lung Hsu
Journal:
Journal of Electronic Testing
Year:
2004
Language:
english
File:
PDF, 170 KB
Your tags:
english, 2004
4
A Graph-Based Approach to Power-Constrained SOC Test Scheduling
Chih-Pin Su
,
Cheng-Wen Wu
Journal:
Journal of Electronic Testing
Year:
2004
Language:
english
File:
PDF, 283 KB
Your tags:
english, 2004
5
Greedy Tree Growing Heuristics on Block-Test Scheduling Under Power Constraints
Valentin Mureşan
,
Xiaojun Wang
,
Valentina Mureşan
,
Mircea Vlăduţiu
Journal:
Journal of Electronic Testing
Year:
2004
Language:
english
File:
PDF, 587 KB
Your tags:
english, 2004
6
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
D. Appello
,
A. Fudoli
,
V. Tancorre
,
P. Bernardi
,
F. Corno
,
M. Rebaudengo
,
M. Sonza Reorda
Journal:
Journal of Electronic Testing
Year:
2004
Language:
english
File:
PDF, 133 KB
Your tags:
english, 2004
7
Testing and Reliability Techniques for High-Bandwidth Embedded RAMs
Kanad Chakraborty
Journal:
Journal of Electronic Testing
Year:
2004
Language:
english
File:
PDF, 165 KB
Your tags:
english, 2004
8
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor
O. Novák
,
Z. Plíva
,
J. Nosek
,
A. Hlawiczka
,
T. Garbolino
,
K. Gucwa
Journal:
Journal of Electronic Testing
Year:
2004
Language:
english
File:
PDF, 209 KB
Your tags:
english, 2004
9
Editorial
Vishwani D. Agrawal
Journal:
Journal of Electronic Testing
Year:
2004
Language:
english
File:
PDF, 26 KB
Your tags:
english, 2004
10
Test Technology Technical Council Newsletter
A. Ivanov
Journal:
Journal of Electronic Testing
Year:
2004
File:
PDF, 112 KB
Your tags:
2004
11
List of Reviewers
Journal:
Journal of Electronic Testing
Year:
2004
File:
PDF, 24 KB
Your tags:
2004
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