![](/img/cover-not-exists.png)
Impact of Top-Surface Tunnel-Oxide Nitridation on Flash Memory Performance and Reliability
Ganguly, U., Guarini, T., Wellekens, D., Date, L., Cho, Y., Rothschild, A., Swenberg, J.Volume:
31
Year:
2010
Language:
english
Pages:
3
DOI:
10.1109/led.2009.2036577
File:
PDF, 408 KB
english, 2010