The dependence of UMOSFET characteristics and reliability on geometry and processing
Suliman, S A, Gollagunta, N, Trabzon, L, Hao, J, Ridley, R S, Knoedler, C M, Dolny, G M, Awadelkarim, O O, Fonash, S JVolume:
16
Year:
2001
Language:
english
Pages:
8
DOI:
10.1088/0268-1242/16/6/305
File:
PDF, 396 KB
english, 2001
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