The Microstructure of Ti/Al and TiN Ohmic Contacts to Gallium Nitride
P. Ruterana, G. Nouet, Th. Kehagias, Ph. Komninou, Th. Karakostas, M. A. di Forte Poisson, F. Huet, H. MorkocVolume:
176
Year:
1999
Language:
english
Pages:
5
DOI:
10.1002/(sici)1521-396x(199911)176:13.0.co;2-r
File:
PDF, 331 KB
english, 1999