Estimation of surface excitation correction factor for 200–5000 eV in Ni from absolute elastic scattering electron spectroscopy
S. Tanuma, S. Ichimura, K. GotoVolume:
30
Year:
2000
Language:
english
Pages:
5
DOI:
10.1002/1096-9918(200008)30:13.0.co;2-n
File:
PDF, 102 KB
english, 2000