Volume 30; Issue 1

Surface and Interface Analysis

Volume 30; Issue 1
1

Preface

Prof Jose M. Sanz
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 7 KB
english, 2000
4

Surface and interface segregation in the oxidation of metals

H. J. Grabke
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 445 KB
english, 2000
5

Characterization of hard disk substrates (NiP/Al, glass) using XPS

D. Ochs, S. Dieckhoff, B. Cord
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 79 KB
english, 2000
6

High-temperature oxidation of industrial FeCrMo steel

A. P. Greeff, C. W. Louw, H. C. Swart
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 131 KB
english, 2000
11

Simultaneous copper runoff and copper surface analysis in an outdoor area

S. Jouen, M. Jean, B. Hannoyer
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 95 KB
english, 2000
14

High-temperature surface oxidation of low-carbon rimming steel

I. Iordanova, M. Surtchev, K. S. Forcey, V. Krastev
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 60 KB
english, 2000
20

Chemical analysis using XPS data and self-organizing maps

K. Obu-Cann, H. Tokutaka, K. Fujimura, K. Yoshihara
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 196 KB
english, 2000
22

Optimized linear decomposition of data obtained during AES depth profiling

J. Kovač, T. Bogataj, A. Zalar
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 98 KB
english, 2000
32

Accurate depth profiling of complex optical coatings

C. Jeynes, N. P. Barradas, H. Rafla-Yuan, B. P. Hichwa, R. Close
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 107 KB
english, 2000
37

XPS and SIMS depth profiling of oxynitrides

L. Vanzetti, M. Bersani, M. Sbetti, M. Anderle
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 79 KB
english, 2000
41

Surface FTIR investigations on CexZr1−xO2 system

M. Daturi, C. Binet, J. C. Lavalley, G. Blanchard
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 88 KB
english, 2000
54

Metallurgical applications of AES: anisotropy of grain boundary segregation

Pavel Lejček
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 180 KB
english, 2000
56

XPS study of surface-active organic compounds on fine ferrous powder

Elisabeth Johansson, Lars Nyborg
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 52 KB
english, 2000
67

Artifacts in AES microanalysis for semiconductor applications

Paul L. King
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 236 KB
english, 2000
68

Degradation of ZnS FED phosphors

H. C. Swart, K. T. Hillie
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 73 KB
english, 2000
83

XPS studies of YBa2Cu3O7−δ/Ag high-TC superconductor

J. F. Silvain, J. P. Chaminade, L. Antunes, J. M. Heintz
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 97 KB
english, 2000
85

Cu(II) adsorption mechanism on pyrite: an XAFS and XPS study

Christopher Weisener, Andrea Gerson
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 149 KB
english, 2000
87

Chemical characterization of surfaces and interfaces with submicron spatial resolution

M. P. Kiskinova
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 388 KB
english, 2000
90

Spectromicroscopy study of an Ni+Ag/Si(111) interface

J. Kovač, L. Gregoratti, S. Günther, A. Kolmakov, M. Marsi, M. Kiskinova
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 127 KB
english, 2000
94

XPS analysis of ultrathin SiO2 film growth on Si by ozone

S. Ichimura, K. Koike, A. Kurokawa, K. Nakamura, H. Itoh
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 97 KB
english, 2000
96

Characterization of thin-film devices for gas sensing

S. Kačiulis, G. Mattogno
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 112 KB
english, 2000
102

Deep-UV antireflective coating: ellipsometry and XPS characterization

X. Boddaert, A. Caramante, E. Josse, B. Delahaye
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 66 KB
english, 2000
107

Photoelectron signal simulation from textured overlayer samples

K. Vutova, G. Mladenov, T. Tanaka, K. Kawabata
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 94 KB
english, 2000
108

XPS and SIMS study: adhesion of polypyrrole film on titanium

K. Idla, L.-S. Johansson, J. M. Campbell, O. Inganäs
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 69 KB
english, 2000
112

Formation of the Si/Cu interface

C. Rojas, E. Román, J. A. Martín-Gago
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 105 KB
english, 2000
114

Electron spectroscopy of single-phase (Al,B)N films

Mirjam Witthaut, Rainer Cremer, Dieter Neuschütz
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 204 KB
english, 2000
124

Ion beam analysis of sputter-deposited gold films for quartz resonators

H. Bergsåker, L. Ilyinsky, G. Portnoff
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 64 KB
english, 2000
125

XPS analysis of the activation process in non-evaporable getter thin films

M. P. Lozano, J. Fraxedas
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 84 KB
english, 2000
127

Characterization of lubricant films on magnetic recording disks by ToF-SIMS

Y. Abe, M. Shibayama, T. Matsuo
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 68 KB
english, 2000
130

Work function change of fresh scratched silicon surface due to gas adsorption

Keiji Nakayama, Lulu Zhang
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 225 KB
english, 2000
136

XPS characterization of sulphated zirconia catalysts: the role of iron

S. Ardizzone, C. L. Bianchi
Journal:
Surface and Interface Analysis
Year:
2000
Language:
english
File:
PDF, 64 KB
english, 2000