Surface properties of microbial cells probed at the nanometre scale with atomic force microscopy
C. J. P. Boonaert, P. G. Rouxhet, Y. F. DufrêneVolume:
30
Year:
2000
Language:
english
Pages:
4
DOI:
10.1002/1096-9918(200008)30:13.0.co;2-y
File:
PDF, 160 KB
english, 2000