Interphase characterization via the stiffness contrast of a...

Interphase characterization via the stiffness contrast of a scanning force microscope in displacement modulation mode

M. Munz, H. Sturm, E. Schulz
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Volume:
30
Year:
2000
Language:
english
Pages:
5
DOI:
10.1002/1096-9918(200008)30:13.0.co;2-g
File:
PDF, 295 KB
english, 2000
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