ToF-SIMS and XPS study of sulphur on carbon black surface
C. Poleunis, X. Vanden Eynde, E. Grivei, H. Smet, N. Probst, P. BertrandVolume:
30
Year:
2000
Language:
english
Pages:
5
DOI:
10.1002/1096-9918(200008)30:13.0.co;2-z
File:
PDF, 85 KB
english, 2000