Semi-quantitative and non-destructive analysis of impurities at a buried interface: Na and the CdS/Cu(In,Ga)Se2 heterojunction
C. Heske, D. Eich, R. Fink, E. Umbach, T. van Buuren, C. Bostedt, S. Kakar, L. J. Terminello, M. M. Grush, T. A. Callcott, F. J. Himpsel, D. L. Ederer, R. C. C. Perera, W. Riedl, F. KargVolume:
30
Year:
2000
Language:
english
Pages:
5
DOI:
10.1002/1096-9918(200008)30:13.0.co;2-l
File:
PDF, 81 KB
english, 2000