XPS analysis with depth resolution of chemical bath-deposited ZnSe thin films
A. M. Chaparro, C. Maffiotte, J. Herrero, M. T. GutiérrezVolume:
30
Year:
2000
Language:
english
Pages:
5
DOI:
10.1002/1096-9918(200008)30:13.0.co;2-9
File:
PDF, 156 KB
english, 2000