XPS study of TiOx thin films prepared by d.c. magnetron sputtering in Ar–O2 gas mixtures
R. Gouttebaron, D. Cornelissen, R. Snyders, J. P. Dauchot, M. Wautelet, M. HecqVolume:
30
Year:
2000
Language:
english
Pages:
4
DOI:
10.1002/1096-9918(200008)30:13.0.co;2-z
File:
PDF, 75 KB
english, 2000