Analysis of reliability and optimization of ESD protection devices supported by modeling and simulation
A. Chvala, D. Donoval, P. Beno, J. Marek, P. Pribytny, M. MolnarVolume:
52
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.microrel.2011.11.020
File:
PDF, 1.30 MB
english, 2012