Effect of localised charges on nanoscale cylindrical...

Microelectronics Reliability 2012 Vol. 52; Iss. 6

Effect of localised charges on nanoscale cylindrical surrounding gate MOSFET: Analog performance and linearity analysis

Rajni Gautam, Manoj Saxena, R.S. Gupta, Mridula Gupta
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Volume:
52
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.microrel.2011.12.014
File:
PDF, 889 KB
english, 2012
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