Characterization and reliability of nMOSFETs on flexible substrates under mechanical strain
Hsuan-ling Kao, Chih-Sheng Yeh, Meng-Ting Chen, Hsien-Chin Chiu, Li-Chun ChangVolume:
52
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.microrel.2011.12.019
File:
PDF, 822 KB
english, 2012