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Temperature dependent drain current model for Gate Stack Insulated Shallow Extension Silicon On Nothing (ISESON) MOSFET for wide operating temperature range
Vandana Kumari, Manoj Saxena, R.S. Gupta, Mridula GuptaVolume:
52
Year:
2012
Language:
english
Pages:
1
DOI:
10.1016/j.microrel.2011.12.021
File:
PDF, 1.44 MB
english, 2012