Characterization of single-sided gate-to-drain non-overlapped implantation nMOSFETs for multi-functional non-volatile memory applications
E.S. Jeng, Y.F. Chen, C.C. Chang, K.M. Peng, S.W. Chou, C.W. Ho, C.F. Huang, J. GongVolume:
68
Year:
2012
Language:
english
Pages:
7
DOI:
10.1016/j.sse.2011.09.012
File:
PDF, 786 KB
english, 2012