A new field dependent mobility model for high frequency channel thermal noise of deep submicron RFCMOS
S.N. Ong, K.S. Yeo, K.W.J. Chew, L.H.K. Chan, X.S. Loo, C.C. Boon, M.A. DoVolume:
68
Year:
2012
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2011.09.017
File:
PDF, 667 KB
english, 2012