VASE and IR spectroscopy: excellent tools to study biaxial...

Thin Solid Films 2004 Vol. 455-456; Iss. none

VASE and IR spectroscopy: excellent tools to study biaxial organic molecular thin films: DiMe-PTCDI on S-passivated GaAs(100)

M. Friedrich, C. Himcinschi, G. Salvan, M. Anghel, A. Paraian, Th. Wagner, T.U. Kampen, D.R.T. Zahn
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
455-456
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2003.11.224
File:
PDF, 144 KB
english, 2004
Conversion to is in progress
Conversion to is failed