Volume 455-456; Issue none

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Thin Solid Films
Volume 455-456; Issue none

Thin Solid Films

Volume 455-456; Issue none

1

Multichannel Mueller matrix ellipsometer based on the dual rotating compensator principle

Chi Chen, Ilsin An, G.M. Ferreira, N.J. Podraza, J.A. Zapien, R.W. Collins

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 392 KB

english, 2004

2

IR–FUV ellipsometry studies on the optical, electronic and vibrational properties of polymeric membranes

M. Gioti, A. Laskarakis, S. Logothetidis

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 194 KB

english, 2004

3

Swelling of a thin B+ implanted polyimide layer—a dynamic spectroscopic ellipsometry study

K.-J. Eichhorn, K. Sahre, M. Günther, G. Suchaneck, G. Gerlach

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 93 KB

english, 2004

4

Infrared ellipsometry characterization of conducting thin organic films

M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, O. Inganäs

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 133 KB

english, 2004

5

Spectroscopic ellipsometry using the grating division-of-amplitude photopolarimeter (G-DOAP)

S. Krishnan, Scott Hampton, R.M.A. Azzam

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 197 KB

english, 2004

6

Relationships among surface processing at the nanometer scale, nanostructure and optical properties of thin oxide films

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 1.00 MB

english, 2004

7

Mueller matrix spectroscopic ellipsometry: formulation and application

A. Laskarakis, S. Logothetidis, E. Pavlopoulou, M. Gioti

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 833 KB

english, 2004

8

Dielectric function of Si nanocrystals embedded in SiO2

B. Gallas, Chih-Cheng Kao, C. Defranoux, S. Fisson, G. Vuye, J. Rivory

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 106 KB

english, 2004

9

Prism spectroscopic ellipsometer

R.M.A. Azzam, F.F. Sudradjat, M. Nazim Uddin

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 185 KB

english, 2004

10

Spectroscopic ellipsometry of carbon nanotube formation in SiC surface decomposition

K. Matsumoto, H. Maeda, Y. Kawaguchi, K. Takahashi, M. Aoyama, T. Yamaguchi, K. Postava

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 408 KB

english, 2004

11

Optical properties of ZnSe and Zn0.87Mn0.13Se epilayers determined by spectroscopic ellipsometry

J. Kvietkova, B. Daniel, M. Hetterich, M. Schubert, D. Spemann

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 130 KB

english, 2004

12

Accurate calibration and optimized measurement: use of an achromatic compensator in rotating polarizer spectroscopic ellipsometry

L. Broch, A. En Naciri, L. Johann

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 565 KB

english, 2004

13

Hydrogen implantation in InGaNAs studied by spectroscopic ellipsometry

G. Leibiger, V. Gottschalch, N. Razek, A. Schindler, M. Schubert

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 104 KB

english, 2004

14

FTIR phase-modulated ellipsometry characterization of hydrogenated amorphous silicon nitride thin films with embedded nanoparticles

A. Canillas, A. Pinyol, J. Sancho-Parramon, J. Ferré-Borrull, E. Bertran

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 432 KB

english, 2004

15

Precision in ellipsometrically determined sample parameters: simulation and experiment

Blaine Johs, Craig M. Herzinger

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 154 KB

english, 2004

16

IR ellipsometry and photoluminescence investigations of Zn1−xBexSe and Zn1−x−yBexMnySe mixed crystals

A.A. Wronkowska, K. Bejtka, H. Arwin, A. Wronkowski, F. Firszt, S. Łęgowski, H. Męczyńska, A. Marasek

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 173 KB

english, 2004

17

Generalized ellipsometry for orthorhombic, absorbing materials: dielectric functions, phonon modes and band-to-band transitions of Sb2S3

M. Schubert, T. Hofmann, C.M. Herzinger, W. Dollase

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 276 KB

english, 2004

18

Infrared ellipsometry of SiC/Si heterostructures with Ge modified interfaces

Ch. Zgheib, Ch. Förster, P. Weih, V. Cimalla, M. Kazan, P. Masri, O. Ambacher, J. Pezoldt

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 280 KB

english, 2004

19

Determination of the anisotropic dielectric function for metal free phthalocyanine thin films

O.D. Gordan, M. Friedrich, D.R.T. Zahn

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 684 KB

english, 2004

20

Coherent and incoherent interference modelling and measurement of anisotropic multilayer stacks using conventional ellipsometry

H. Touir, M. Stchakovsky, R. Ossikovski, M. Warenghem

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 106 KB

english, 2004

21

New design of a spectroscopic ellipsometer by using a spectrometer with multiple gratings and a two-dimensional CCD array detector

Hai-Yang You, Jian-Hu Jia, Jian-Ke Chen, Tao Han, Wei-Ming Ni, Song-You Wang, Jin Li, Rong-Jun Zhang, Yue-Mei Yang, Liang-Yao Chen, David W. Lynch

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 292 KB

english, 2004

22

Investigation of optical anisotropy of Langmuir–Blodgett films of long-chain acetylenic acids

I.A. Badmaeva, L.A. Nenasheva, V.G. Polovinkin, S.M. Repinsky, L.L. Sveshnikova

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 171 KB

english, 2004

23

General virtual interface algorithm for in situ spectroscopic ellipsometric data analysis

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 457 KB

english, 2004

24

Error function for interpretations of ellipsometric measurements

V.G. Polovinkin

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 91 KB

english, 2004

25

Far-infrared magnetooptic generalized ellipsometry: determination of free-charge-carrier parameters in semiconductor thin film structures

Mathias Schubert, Tino Hofmann, Craig M. Herzinger

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 234 KB

english, 2004

26

Infrared spectroscopic ellipsometry study of molecular orientation induced anisotropy in polymer substrates

Corey Bungay, Thomas E. Tiwald

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 269 KB

english, 2004

27

Application of spectral and temporal weighted error functions for data analysis in real-time spectroscopic ellipsometry

J.A. Zapien, A.S. Ferlauto, R.W. Collins

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 189 KB

english, 2004

28

Spectroellipsometric evaluation of colour and oxidation resistance of TiMgN coatings

O. Banakh, M. Balzer, M. Fenker, A. Blatter

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 157 KB

english, 2004

29

Analysis of the optical properties and structure of sculptured thin films from spectroscopic Mueller matrix ellipsometry

N.J. Podraza, Chi Chen, Ilsin An, G.M. Ferreira, P.I. Rovira, R. Messier, R.W. Collins

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 224 KB

english, 2004

30

An in situ study of mesostructured CTAB-silica film formation using infrared ellipsometry: evolution of water content

A. Brunet-Bruneau, A. Bourgeois, F. Cagnol, D. Grosso, C. Sanchez, J. Rivory

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 141 KB

english, 2004

31

Calibration and data reduction for a UV-extended rotating-compensator multichannel ellipsometer

Ilsin An, J.A. Zapien, Chi Chen, A.S. Ferlauto, A.S. Lawrence, R.W. Collins

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 149 KB

english, 2004

32

Anisotropic optical functions of pentaerythrytol, an uniaxial organic crystal

A. Sassella, Th. Wagner, C. Herzinger, Genbo Su, Youping He, Chenjia Chen

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 195 KB

english, 2004

33

Optical purity evaluation of the noble metal by the ellipsometric method

Peng Zhou, Song-You Wang, Jing Li, Rong-Jun Zhang, Hai-Yang You, Zhuo-Chen Shen, Liang-Yao Chen

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 102 KB

english, 2004

34

VASE and IR spectroscopy: excellent tools to study biaxial organic molecular thin films: DiMe-PTCDI on S-passivated GaAs(100)

M. Friedrich, C. Himcinschi, G. Salvan, M. Anghel, A. Paraian, Th. Wagner, T.U. Kampen, D.R.T. Zahn

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 144 KB

english, 2004

35

Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry

C. Bundesmann, N. Ashkenov, M. Schubert, A. Rahm, H.v. Wenckstern, E.M. Kaidashev, M. Lorenz, M. Grundmann

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 155 KB

english, 2004

36

Evaluation of compositional depth profiles in mixed-phase (amorphous+crystalline) silicon films from real time spectroscopic ellipsometry

A.S. Ferlauto, G.M. Ferreira, R.J. Koval, J.M. Pearce, C.R. Wronski, R.W. Collins, M.M. Al-Jassim, K.M. Jones

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 146 KB

english, 2004

37

Description of the porosity of inhomogeneous porous low-k films using solvent adsorption studied by spectroscopic ellipsometry in the visible range

A. Bourgeois, A. Brunet Bruneau, V. Jousseaume, N. Rochat, S. Fisson, B. Demarets, J. Rivory

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 123 KB

english, 2004

38

Concentration and size dependence of optical properties of Ag:Bi2O3 composite films by using the co-sputtering method

Peng Zhou, Hai-Yang You, Jian-Hu Jia, Jing Li, Tao Han, Song-You Wang, Rong-Jun Zhang, Yu-Xiang Zheng, Liang-Yao Chen

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 270 KB

english, 2004

39

Magneto-optical ellipsometry of systems containing thick layers

K. Postava, O. Životský, J. Pištora, T. Yamaguchi

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 90 KB

english, 2004

40

Complete wetting transition at the fluid–vapour interface of Ga–Bi studied by spectroscopic ellipsometry

S. Dogel, D. Nattland, W. Freyland

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 208 KB

english, 2004

41

Real-time studies of amorphous and microcrystalline Si:H growth by spectroscopic ellipsometry and infrared spectroscopy

Hiroyuki Fujiwara, Michio Kondo, Akihisa Matsuda

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 941 KB

english, 2004

42

Analytical model for the optical functions of amorphous semiconductors and its applications for thin film solar cells

A.S. Ferlauto, G.M. Ferreira, J.M. Pearce, C.R. Wronski, R.W. Collins, X. Deng, G. Ganguly

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 175 KB

english, 2004

43

In-situ studies of the growth of amorphous and nanocrystalline silicon using real time spectroscopic ellipsometry

D.H. Levi, B.P. Nelson, E. Iwanizcko, C.W. Teplin

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 247 KB

english, 2004

44

Optical properties of diamond-like carbon films containing SiOx studied by the combined method of spectroscopic ellipsometry and spectroscopic reflectometry

Daniel Franta, Ivan Ohlı́dal, Vilma Buršı́ková, Lenka Zajı́čková

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 142 KB

english, 2004

45

Complete characterization of rough polymorphous silicon films by atomic force microscopy and the combined method of spectroscopic ellipsometry and spectroscopic reflectometry

Daniel Franta, Ivan Ohlı́dal, Petr Klapetek, Pere Roca i Cabarrocas

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 122 KB

english, 2004

46

Ex situ spectroscopic ellipsometry investigations of chemical vapor deposited nanocomposite carbon thin films

S. Gupta, B.R. Weiner, G. Morell

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 530 KB

english, 2004

47

In situ ellipsometry for control of Hg1−xCdxTe nanolayer structures and inhomogeneous layers during MBE growth

V.A. Shvets, S.V. Rykhlitski, E.V. Spesivtsev, N.A. Aulchenko, N.N. Mikhailov, S.A. Dvoretsky, Yu.G. Sidorov, R.N. Smirnov

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 187 KB

english, 2004

48

Optical and magnetooptical properties of bismuth and gallium substituted iron garnet films

Fredrik Hansteen, Lars Egil Helseth, Tom H. Johansen, Ola Hunderi, Andrei Kirilyuk, Theo Rasing

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 104 KB

english, 2004

49

Contributions to the static dielectric constant of low-k xerogel films derived from ellipsometry and IR spectroscopy

C. Himcinschi, M. Friedrich, S. Frühauf, S.E. Schulz, T. Gessner, D.R.T. Zahn

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 455 KB

english, 2004

50

Study of structure and optical properties of silver oxide films by ellipsometry, XRD and XPS methods

Xiao-Yong Gao, Song-You Wang, Jing Li, Yu-Xiang Zheng, Rong-Jun Zhang, Peng Zhou, Yue-Mei Yang, Liang-Yao Chen

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 156 KB

english, 2004

51

Dielectric function of thin metal films by combined in situ transmission ellipsometry and intensity measurements

G.K. Pribil, B. Johs, N.J. Ianno

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 333 KB

english, 2004

52

Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films

E. Masetti, J. Bulir, S. Gagliardi, V. Janicki, A. Krasilnikova, G. Di Santo, C. Coluzza

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 114 KB

english, 2004

53

Spectroscopic ellipsometry of TaNx and VN films

J. Mistrik, K. Takahashi, R. Antos, M. Aoyama, T. Yamaguchi, Y. Anma, Y. Fukuda, M.B. Takeyama, A. Noya, Z.-T. Jiang, S.M. Thurgate, G.V. Riessen

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 126 KB

english, 2004

54

Spectroscopic ellipsometry of pulsed laser irradiated c-Ge surfaces

J. Mistrik, R. Antos, K. Murakami, M. Aoyama, T. Yamaguchi, Y. Anma, Y. Fukuda, A. Medvid’, A. Michko

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 439 KB

english, 2004

55

Correlation between silicon nanocrystalline size effect and spectroscopic ellipsometry responses

A. En Naciri, M. Mansour, L. Johann, J.J. Grob, C. Eckert

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 146 KB

english, 2004

56

Optical characterization of ferroelectric strontium–bismuth–tantalate (SBT) thin films

C. Schmidt, P. Petrik, C. Schneider, M. Fried, T. Lohner, I. Bársony, J. Gyulai, H. Ryssel

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 150 KB

english, 2004

57

UV–VUV spectroscopic ellipsometry of ternary MgxZn1−xO (0≤x≤0.53) thin films

R. Schmidt-Grund, M. Schubert, B. Rheinländer, D. Fritsch, H. Schmidt, E.M. Kaidashev, M. Lorenz, C.M. Herzinger, M. Grundmann

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 253 KB

english, 2004

58

Vacuum ultraviolet spectroscopic ellipsometry investigations of guanine layers on H-passivated Si(1 1 1) surfaces

S.D. Silaghi, M. Friedrich, R. Scholz, T.U. Kampen, C. Cobet, N. Esser, W. Richter, W. Braun, D.R.T. Zahn

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 82 KB

english, 2004

59

Spectroellipsometric study of the sol–gel nanocrystalline ITO multilayer films

T.F. Stoica, M. Gartner, M. Losurdo, V. Teodorescu, M. Blanchin, T. Stoica, M. Zaharescu

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 582 KB

english, 2004

60

Photopolarimetric investigations of liquid crystals–electrochromic oxides interface

G. Strangi, C. Versace, N. Scaramuzza, E. Cazzanelli, V. Bruno, C. Vena, S. D'Elia, R. Bartolino

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 314 KB

english, 2004

61

Spectroscopic ellipsometry investigation of amorphous carbon films with different sp3 content: relation with protein adsorption

M. Vinnichenko, R. Gago, N. Huang, Y.X. Leng, H. Sun, U. Kreissig, M.P. Kulish, M.F. Maitz

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 194 KB

english, 2004

62

In situ spectroscopic ellipsometry of hydrogen-argon plasma cleaned silicon surfaces

Ch. Förster, F. Schnabel, P. Weih, Th. Stauden, O. Ambacher, J. Pezoldt

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 485 KB

english, 2004

63

Time-resolved microellipsometry for rapid thermal processes monitoring

E.V. Spesivtsev, S.V. Rykhlitsky, V.A. Shvets, S.I. Chikichev, A.S. Mardezhov, N.I. Nazarov, V.A. Volodin

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 205 KB

english, 2004

64

In situ ellipsometric and electrochemical monitoring of the oxidation of a Pb–Ca–Sn alloy used in the lead acid batteries

N. Stein, G. Bourguignon, L. Raboin, L. Broch, L. Johann, E. Rocca

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 1.25 MB

english, 2004

65

Reflection anisotropy spectroscopy of molecular assembly at metal surfaces

D.S. Martin, P. Weightman

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 539 KB

english, 2004

66

Atomic-layer resolved monitoring of thermal oxidation of Si(001) by reflectance difference oscillation technique

Tetsuji Yasuda, Masayasu Nishizawa, Naoto Kumagai, Satoshi Yamasaki, Hitoshi Oheda, Kikuo Yamabe

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 228 KB

english, 2004

67

Calculation of surface optical properties: from qualitative understanding to quantitative predictions

W.G. Schmidt, K. Seino, P.H. Hahn, F. Bechstedt, W. Lu, S. Wang, J. Bernholc

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 308 KB

english, 2004

68

Ellipsometry on uniaxial ZnO and Zn1−xMgxO thin films grown on (0001) sapphire substrate

T.D. Kang, Hosun Lee, Won-Il Park, Gyu-Chul Yi

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 219 KB

english, 2004

69

Spectroscopic ellipsometry for in-line monitoring of silicon nitrides

Candi S. Cook, Terry Daly, Ran Liu, Michael Canonico, Q. Xie, R.B. Gregory, Stefan Zollner

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 147 KB

english, 2004

70

Oxidation behaviour of thin silver films deposited on plastic web characterized by spectroscopic ellipsometry (SE)

H Sahm, C Charton, R Thielsch

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 320 KB

english, 2004

71

A memory application of light reflection from anisotropic micro-structured thin films

M. Tazawa, G. Xu, P. Jin, H. Arwin

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 320 KB

english, 2004

72

Gate oxide metrology and silicon piezooptics

Stefan Zollner, Ran Liu, A.A. Volinsky, Ted White, Bich-Yen Nguyen, C.S. Cook

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 212 KB

english, 2004

73

Optical constants and interband transitions of Ge1−xSnx alloys (x

Candi S. Cook, Stefan Zollner, Matthew R. Bauer, Pavan Aella, John Kouvetakis, Jose Menendez

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 125 KB

english, 2004

74

Visible and infrared ellipsometry applied to the study of metal-containing diamond-like carbon coatings

C. Corbella, E. Pascual, A. Canillas, E. Bertran, J.L. Andújar

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 293 KB

english, 2004

75

Spectroscopic ellipsometry characterization of interface reactivity in GaAs-based superlattices

M. Losurdo, D. Giuva, M.M. Giangregorio, G. Bruno, A.S. Brown

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 794 KB

english, 2004

76

Optical properties of silicon carbide polytypes below and around bandgap

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 1.02 MB

english, 2004

77

Application of the genetic algorithms in spectroscopic ellipsometry

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 589 KB

english, 2004

78

Performance analysis of ellipsometer systems

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 342 KB

english, 2004

79

Far-infrared dielectric function and phonon modes of spontaneously ordered (AlxGa1−x)0.52In0.48P

Tino Hofmann, Mathias Schubert, Volker Gottschalch

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 151 KB

english, 2004

80

Comparison of the capabilities of rotating-analyzer and rotating-compensator ellipsometers by measurements on a single system

T. Mori, D.E. Aspnes

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 162 KB

english, 2004

81

Expanding horizons: new developments in ellipsometry and polarimetry

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 269 KB

english, 2004

82

Optical anisotropy relevant to rotating-compensator polarimeters: application to the monoplate retarder

M. Asar, D.E. Aspnes

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 101 KB

english, 2004

83

Precision auto-alignment for incident angle of an ellipsometer using specimen stage

Sunglim Park, DaeGab Gweon, Young Dong Kim

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 174 KB

english, 2004

84

In situ calibration technique for photoelastic modulator in ellipsometry

M.W. Wang, F.H. Tsai, Y.F. Chao

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 295 KB

english, 2004

85

Photo-interferometric spectroscopic ellipsometry

J.C. Martinez-Antón, O. Esteban

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 193 KB

english, 2004

86

Evaluation of ellipsometric measurements using complex strategies

O. Polgár, M. Fried, T. Lohner, I. Bársony

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 1.06 MB

english, 2004

87

General methods for optimized design and calibration of Mueller polarimeters

A. De Martino, E. Garcia-Caurel, B. Laude, B. Drévillon

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 377 KB

english, 2004

88

Spectroscopic Mueller polarimeter based on liquid crystal devices

E. Garcia-Caurel, A. De Martino, B. Drévillon

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 322 KB

english, 2004

89

Optical properties of anisotropic materials: an experimental approach

M.I. Alonso, M. Garriga

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 431 KB

english, 2004

90

Generalized magneto-optical ellipsometry in ferromagnetic metals

G. Neuber, R. Rauer, J. Kunze, J. Backstrom, M. Rübhausen

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 537 KB

english, 2004

91

Development and test of a new grating-polarimeter and its application in ellipsometric measurements

E. Masetti, A. Krasilnikova

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 152 KB

english, 2004

92

Far-infrared ellipsometry using a synchrotron light source—the dielectric response of the cuprate high Tc superconductors

C. Bernhard, J. Humlı́cek, B. Keimer

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 145 KB

english, 2004

93

Infrared study of YBa2Cu3O7/La0.67Ca0.33MnO3 superlattices

A. Dubroka, G. Cristiani, H.-U. Habermeier, J. Humlı́ček

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 146 KB

english, 2004

94

Diffraction effects in infrared ellipsometry of conducting samples

J. Humlı́ček, C. Bernhard

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 155 KB

english, 2004

95

Simultaneous determination of bulk isotropic and surface-induced anisotropic complex dielectric functions of semiconductors from high speed Mueller matrix ellipsometry

Chi Chen, Ilsin An, R.W. Collins

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 163 KB

english, 2004

96

Optical characterization of aluminum-doped zinc oxide films by advanced dispersion theories

Andreas Pflug, Volker Sittinger, Florian Ruske, Bernd Szyszka, Georg Dittmar

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 621 KB

english, 2004

97

Optical properties study of MgB2

D. Chvostová, V. Železný, L. Pajasová, A. Tarasenko, A. Plecenı́k, P. Kúš, L. Satrapinský

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 108 KB

english, 2004

98

Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry

O.P.A. Lindquist, M. Schubert, H. Arwin, K. Järrendahl

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 114 KB

english, 2004

99

Ion implantation-caused damage in SiC measured by spectroscopic ellipsometry

P. Petrik, E.R. Shaaban, T. Lohner, G. Battistig, M. Fried, J. Garcia Lopez, Y. Morilla, O. Polgár, J. Gyulai

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 175 KB

english, 2004

100

Phase-modulated spectroscopic ellipsometry and polarized transmission intensity studies of wide-gap biaxial CaGa2S4

Yonggu Shim, Nazim Mamedov, Nobuyuki Yamamoto

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 131 KB

english, 2004

101

Structure analysis of organic films by mid-infrared ellipsometry

K. Hinrichs, A. Röseler, M. Gensch, E.H. Korte

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 136 KB

english, 2004

102

Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)

O. Bonaventurová Zrzavecká, A. Nebojsa, K. Navrátil, S. Nešpůrek, J. Humlı́ček

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 148 KB

english, 2004

103

Effect of ion irradiation on the optical properties and room temperature oxidation of copper surface

L.V. Poperenko, Essam Ramadan Shaaban, N.Q. Khánh, V.S. Stashchuk, M.V. Vinnichenko, I.V. Yurgelevich, D.V. Nosach, T. Lohner

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 117 KB

english, 2004

104

Envelope analysis in spectroscopic ellipsometry of thin films. Application to a weakly-absorbing polymer film

J.C. Martinez-Antón, J.A. Gómez-Pedrero, A. Álvarez-Herrero

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 180 KB

english, 2004

105

Parametric modeling of the dielectric functions of Cd1−xMgxTe alloy films

Y.S. Ihn, T.J. Kim, T.H. Ghong, Y.D. Kim, D.E. Aspnes, J. Kossut

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 163 KB

english, 2004

106

The finite difference time domain method as a numerical tool for studying the polarization optical response of rough surfaces

B. Lehner, K. Hingerl

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 1.09 MB

english, 2004

107

Characterization of interfacial layer of ultrathin Zr silicate on Si(100) using spectroscopic ellipsometry and HRTEM

H. Ahn, H.-W. Chen, D. Landheer, X. Wu, L.J. Chou, T.-S. Chao

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 280 KB

english, 2004

108

Spectroscopic ellipsometry analysis for investigation of the modification of thin film p-a-Si1−xCx:H after ultraviolet treatment in an Argon ambient

Seung Yeop Myong, Sang Soo Kim, Koeng Su Lim

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 251 KB

english, 2004

109

Ellipsometric characterisation of heterogeneous 2D layers

Herbert Wormeester, E. Stefan Kooij, Agnes Mewe, Sander Rekveld, Bene Poelsema

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 932 KB

english, 2004

110

Depth distribution of disorder and cavities in high dose helium implanted silicon characterized by spectroscopic ellipsometry

P. Petrik, F. Cayrel, M. Fried, O. Polgár, T. Lohner, L. Vincent, D. Alquier, J. Gyulai

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 278 KB

english, 2004

111

Ellipsometry characterization of oxidized copper layers for chemical mechanical polishing process

H. Nishizawa, Y. Tateyama, T. Saitoh

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 188 KB

english, 2004

112

The simultaneous determination of n, k, and t from polarimetric data

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 152 KB

english, 2004

113

Water adsorption in porous TiO2–SiO2 sol–gel films analyzed by spectroscopic ellipsometry

A. Alvarez-Herrero, G. Ramos, F. del Monte, E. Bernabeu, D. Levy

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 299 KB

english, 2004

114

Determination of refractive index of printed and unprinted paper using spectroscopic ellipsometry

J.W.P. Bakker, G. Bryntse, H. Arwin

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 119 KB

english, 2004

115

The ideal vehicle for optical model development: porous silicon multilayers

J. Volk, M. Fried, A.L. Tóth, I. Bársony

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 983 KB

english, 2004

116

Spectroscopic ellipsometry study of focused ion beam induced GaAs surface modification

B. Basnar, A. Lugstein, E. Bertagnolli, E. Gornik

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 891 KB

english, 2004

117

Dose-dependence of ion implantation-caused damage in silicon measured by ellipsometry and backscattering spectrometry

M. Fried, P. Petrik, T. Lohner, N.Q. Khánh, O. Polgár, J. Gyulai

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 218 KB

english, 2004

118

Characterisation of porous silicon composite material by spectroscopic ellipsometry

M. Gaillet, M. Guendouz, M. Ben Salah, B. Le Jeune, G. Le Brun

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 366 KB

english, 2004

119

Ellipsometric analysis of gamma radiation effects on standard optical coatings used in aerospace applications

M. Fernández-Rodrı́guez, G. Ramos, F. del Monte, D. Levy, C.G. Alvarado, A. Núñez, A. Álvarez-Herrero

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 271 KB

english, 2004

120

Spectroellipsometric characterization of sol–gel TiO2–CuO thin coatings

M. Gartner, R. Scurtu, A. Ghita, M. Zaharescu, M. Modreanu, C. Trapalis, M. Kokkoris, G. Kordas

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 294 KB

english, 2004

121

Generalized spectroscopic ellipsometry and Mueller-matrix study of twisted nematic and super twisted nematic liquid crystals

J.N. Hilfiker, B. Johs, C.M. Herzinger, J.F. Elman, E. Montbach, D. Bryant, P.J. Bos

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 346 KB

english, 2004

122

Mn1−xFex alloy films studied by optical and magneto-optical spectroscopies

J.B. Kim, S.Y. Park, Y.P. Lee, Y.V. Kudryavtsev, R. Gontarz, B. Szymański

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 102 KB

english, 2004

123

Biplate artifacts in rotating-compensator ellipsometers

K. Ebert, D.E. Aspnes

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 135 KB

english, 2004

124

Control of etch depth in patterned semiconductor substrates using real time spectroscopic ellipsometry

S.-J. Cho, P.G. Snyder, N.J. Ianno, C.M. Herzinger, B. Johs

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 699 KB

english, 2004

125

In-situ spectroscopic ellipsometry investigation and control of GaN growth mode in metal-organic vapor phase epitaxy at low pressures of 20 Torr

B. Cao, K. Xu, Y. Ishitani, A. Yoshikawa

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 564 KB

english, 2004

126

In-situ growth monitoring by spectroscopy ellipsometry of MOCVD cubic-GaN(001)

A. Montaigne Ramil, K. Schmidegg, A. Bonanni, H. Sitter, D. Stifter, Li Shunfeng, D.J. As, K. Lischka

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 104 KB

english, 2004

127

Protein monolayers monitored by internal reflection ellipsometry

M. Poksinski, H. Arwin

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 247 KB

english, 2004

128

Use of in-situ spectroscopic ellipsometry to study aluminium/oxide surface modifications in chloride and sulfuric solutions

S. Van Gils, C.A. Melendres, H. Terryn, E. Stijns

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 134 KB

english, 2004

129

Ellipsometric monitoring of molecular evolution in freely suspended films of M12/10 ferroelectric liquid crystal

E.G. Bortchagovsky, A. Deineka, M. Glogarová, V. Hamplová, L. Jastrabı́k, M. Kašpar

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 219 KB

english, 2004

130

Generalized ellipsometry for the characterization of anisotropic materials: influence of the sample adjustment on the extracted optical indices

P. Boher, J.P. Piel, B. Sacépé

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 172 KB

english, 2004

131

CO2 sorption of a ceramic separation membrane

Herbert Wormeester, Nieck E. Benes, Gerald I. Spijksma, Henk Verweij, Bene Poelsema

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 139 KB

english, 2004

132

Industrial applications of spectroscopic ellipsometry

Harland G. Tompkins

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 381 KB

english, 2004

133

Spectroscopic ellipsometry (SE) and grazing X-ray reflectometry (GXR) analyses on tungsten carbide films for diffusion barrier in copper metallization schemes

Lianchao Sun, Jean-Claude Fouere, Timo Sammet, Michael Hatzistergos, Harry Efstathiadis

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 844 KB

english, 2004

134

Spectroscopic ellipsometry study on e-beam deposited titanium dioxide films

Lianchao Sun, Ping Hou

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 880 KB

english, 2004

135

Spectroscopic ellipsometry on biological materials – investigation of hydration dynamics and structural properties

B. Schulz, D. Chan, J. Bäckström, M. Rübhausen

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 543 KB

english, 2004

136

Spectroscopic ellipsometry characterization of ZnO–In2O3 systems

H. El Rhaleb, A. En Naciri, R. Dounia, L. Johann, A. Hakam, M. Addou

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 291 KB

english, 2004

137

Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry

L.M. Karlsson, M. Schubert, N. Ashkenov, H. Arwin

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 377 KB

english, 2004

138

Integrated rotating-compensator polarimeter for real-time measurements and analysis of organometallic chemical vapor deposition

K. Flock, S.-J. Kim, M. Asar, I.K. Kim, D.E. Aspnes

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 614 KB

english, 2004

139

Correlations between the microstructure of Ag-Si3N4 multilayers and their optical properties

T. Girardeau, S. Camelio, D. Babonneau, J. Toudert, A. Barranco

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 421 KB

english, 2004

140

Observation of the cascaded phase transformation of Ge–Sb–Te alloy at elevated temperature by using nanosecond time resolved ellipsometry

Sang Jun Kim, Young D. Park, Sung Hyuck An, Sang Youl Kim

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 335 KB

english, 2004

141

Application of FTIR ellipsometry to detect and classify microorganisms

Enric Garcia-Caurel, Jacqueline Nguyen, Laurent Schwartz, Bernard Drévillon

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 281 KB

english, 2004

142

Automated metrology system including VUV spectroscopic ellipsometry and X-ray reflectometry for 300 mm silicon microelectronics

P Boher, P Evrard, O Condat, C Dos Reis, C Defranoux, J.Ph Piel, J.L Stehle, E Bellandi

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 201 KB

english, 2004

143

In situ measurements of chemical sensor film dynamics by spectroscopic ellipsometry. Three case studies

Imants Zudans, William R. Heineman, Carl J. Seliskar

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 112 KB

english, 2004

144

Infrared spectroscopic ellipsometry applied to the characterization of ultra shallow junction on silicon and SOI

C. Defranoux, T. Emeraud, S. Bourtault, J. Venturini, P. Boher, M. Hernandez, C. Laviron, T. Noguchi

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 826 KB

english, 2004

145

Mueller-matrix characterization of liquid crystals

J.N. Hilfiker, C.M. Herzinger, T. Wagner, Antigone Marino, Guiseppe Delgais, Giancarlo Abbate

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 296 KB

english, 2004

146

Realtime layer-by-layer analysis for multilayer fabrication monitoring by an automatic null ellipsometer

T. Tsuru, T. Tsutou, M. Yamamoto

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 220 KB

english, 2004

147

Application of in-situ ellipsometry to the fabrication of multi-layer optical coatings with sub-nanometre accuracy

Svetlana Dligatch, Roger P. Netterfield, Barry Martin

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 261 KB

english, 2004

148

Mueller matrix ellipsometry study of uniaxial deuterated potassium dihydrogen phosphate (DKDP)

R.A. Synowicki, James N. Hilfiker, Pamela K. Whitman

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 109 KB

english, 2004

149

Optical properties of bulk c-ZrO2, c-MgO and a-As2S3 determined by variable angle spectroscopic ellipsometry

R.A. Synowicki, Thomas E. Tiwald

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 166 KB

english, 2004

150

A new multiple wavelength ellipsometric imager: design, limitations and applications

P. Boher, O. Thomas, J.P. Piel, J.L. Stehle

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 2.30 MB

english, 2004

151

Fine art painting characterization by spectroscopic ellipsometry: preliminary measurements on varnish layers

C. Christofides, B. Castellon, A. Othonos, K. Polikreti, C. de Deyne

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 1.14 MB

english, 2004

152

Spectroscopic ellipsometry and reflectometry from gratings (Scatterometry) for critical dimension measurement and in situ, real-time process monitoring

Hsu-Ting Huang, Fred L. Terry Jr

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 409 KB

english, 2004

153

Editorial Board

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 27 KB

english, 2004

154

Author Index

Journal:

Thin Solid Films

Year:

2004

File:

PDF, 41 KB

2004

155

Subject Index

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 117 KB

english, 2004

156

Preface

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 63 KB

english, 2004