Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films
E. Masetti, J. Bulir, S. Gagliardi, V. Janicki, A. Krasilnikova, G. Di Santo, C. ColuzzaVolume:
455-456
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2003.11.244
File:
PDF, 114 KB
english, 2004