Fundraising September 15, 2024 – October 1, 2024 About fundraising

Ellipsometric and XPS analysis of the interface between...

Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films

E. Masetti, J. Bulir, S. Gagliardi, V. Janicki, A. Krasilnikova, G. Di Santo, C. Coluzza
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
455-456
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2003.11.244
File:
PDF, 114 KB
english, 2004
Conversion to is in progress
Conversion to is failed