UV–VUV spectroscopic ellipsometry of ternary MgxZn1−xO...

Thin Solid Films 2004 Vol. 455-456; Iss. none

UV–VUV spectroscopic ellipsometry of ternary MgxZn1−xO (0≤x≤0.53) thin films

R. Schmidt-Grund, M. Schubert, B. Rheinländer, D. Fritsch, H. Schmidt, E.M. Kaidashev, M. Lorenz, C.M. Herzinger, M. Grundmann
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Volume:
455-456
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2003.11.249
File:
PDF, 253 KB
english, 2004
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