Generalized spectroscopic ellipsometry and Mueller-matrix...

Thin Solid Films 2004 Vol. 455-456; Iss. none

Generalized spectroscopic ellipsometry and Mueller-matrix study of twisted nematic and super twisted nematic liquid crystals

J.N. Hilfiker, B. Johs, C.M. Herzinger, J.F. Elman, E. Montbach, D. Bryant, P.J. Bos
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Volume:
455-456
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2004.01.031
File:
PDF, 346 KB
english, 2004
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