Application of FTIR ellipsometry to detect and classify...

Thin Solid Films 2004 Vol. 455-456; Iss. none

Application of FTIR ellipsometry to detect and classify microorganisms

Enric Garcia-Caurel, Jacqueline Nguyen, Laurent Schwartz, Bernard Drévillon
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Volume:
455-456
Year:
2004
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2004.02.005
File:
PDF, 281 KB
english, 2004
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