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Spectrogoniometry and the WANTED method for thickness and refractive index determination
J.C. Martı́nez-Antón, E. BernabeuVolume:
313-314
Year:
1998
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(97)00775-x
File:
PDF, 315 KB
english, 1998