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Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films
N.V Edwards, S.D Yoo, M.D Bremser, M.N Horton, N.R Perkins, T.W Weeks Jr., H Liu, R.A Stall, T.F Kuech, R.F Davis, D.E AspnesVolume:
313-314
Year:
1998
Language:
english
Pages:
6
DOI:
10.1016/s0040-6090(97)00815-8
File:
PDF, 178 KB
english, 1998