Ellipsometric and reflectance-anisotropy measurements on rotating samples
K. Haberland, O. Hunderi, M. Pristovsek, J.-T. Zettler, W. RichterVolume:
313-314
Year:
1998
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(97)00897-3
File:
PDF, 312 KB
english, 1998