Fabrication of silicon aperture probes for scanning...

Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining

C. Lehrer, L. Frey, S. Petersen, Th. Sulzbach, O. Ohlsson, Th. Dziomba, H.U. Danzebrink, H. Ryssel
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
57-58
Year:
2001
Language:
english
Pages:
8
DOI:
10.1016/s0167-9317(01)00463-4
File:
PDF, 722 KB
english, 2001
Conversion to is in progress
Conversion to is failed