Characterization of titanium silicide by Raman spectroscopy...

Characterization of titanium silicide by Raman spectroscopy for submicron IC processing

E.H Lim, G Karunasiri, S.J Chua, Z.X Shen, H Wong, K.L Pey, K.H Lee, L Chan
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Volume:
43-44
Year:
1998
Language:
english
Pages:
7
DOI:
10.1016/s0167-9317(98)00234-2
File:
PDF, 157 KB
english, 1998
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