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Si/SiGe valence band offset determination using photoluminescence and DLTS in SiGe quantum-well MOS capacitors
H Gamez-Cuatzin, A Daami, L Garchery, I Sagnes, Y Campidelli, G BrémondVolume:
43-44
Year:
1998
Language:
english
Pages:
8
DOI:
10.1016/s0167-9317(98)00242-1
File:
PDF, 145 KB
english, 1998