A comprehensive method combining deep-depletion profiling...

A comprehensive method combining deep-depletion profiling and capacitance transients to evaluate energy and depth distribution of MOS bulk defects

Kerber, M.
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Volume:
39
Year:
1992
Language:
english
Pages:
6
DOI:
10.1109/16.123498
File:
PDF, 544 KB
english, 1992
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