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Influence of the series resistance of on-chip power supply buses on internal device failure after ESD stress [MOS devices]
Terletzki, H., Nikutta, W., Reczek, W.Volume:
40
Year:
1993
Language:
english
Pages:
3
DOI:
10.1109/16.239752
File:
PDF, 322 KB
english, 1993