Non-isothermal analysis of breakdown in SOI transistors

IEEE Transactions on Electron Devices 1993 Vol. 40; Iss. 11

Non-isothermal analysis of breakdown in SOI transistors

Apanovich, Y., Lyumkis, E., Polsky, B., Blakey, P.
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Volume:
40
Year:
1993
Language:
english
Pages:
3
DOI:
10.1109/16.239756
File:
PDF, 275 KB
english, 1993
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