Determination of the doping profile near the...

Determination of the doping profile near the metal-semiconductor interface of ZrN/GaAs contacts

Fourkas, R.M., Cheung, N.W.
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Volume:
35
Year:
1988
Language:
english
Pages:
3
DOI:
10.1109/16.2564
File:
PDF, 320 KB
english, 1988
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