The effects of annealing on the switching characteristics...

IEEE Transactions on Electron Devices 1989 Vol. 36; Iss. 5

The effects of annealing on the switching characteristics of an ion-implanted silicon MESFET

Chattopadhyay, S.N., Pal, B.B.
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Volume:
36
Year:
1989
Language:
english
Pages:
10
DOI:
10.1109/16.299674
File:
PDF, 685 KB
english, 1989
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