Coupled Monte Carlo-drift diffusion analysis of...

IEEE Transactions on Electron Devices 1989 Vol. 36; Iss. 5

Coupled Monte Carlo-drift diffusion analysis of hot-electron effects in MOSFETs

Higman, J.M., Hess, K., Hwang, C.G., Dutton, R.W.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
36
Year:
1989
Language:
english
Pages:
8
DOI:
10.1109/16.299675
File:
PDF, 929 KB
english, 1989
Conversion to is in progress
Conversion to is failed