Measurement and modeling of the sidewall threshold voltage...

IEEE Transactions on Electron Devices 1989 Vol. 36; Iss. 5

Measurement and modeling of the sidewall threshold voltage of mesa-isolated SOI MOSFETs

Matloubian, M., Sundaresan, R., Lu, H.
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Volume:
36
Year:
1989
Language:
english
Pages:
5
DOI:
10.1109/16.299676
File:
PDF, 552 KB
english, 1989
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