A model relating wearout to breakdown in thin oxides

IEEE Transactions on Electron Devices 1994 Vol. 41; Iss. 9

A model relating wearout to breakdown in thin oxides

Dumin, D.J., Maddux, J.R., Scott, R.S., Subramoniam, R.
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Volume:
41
Year:
1994
Language:
english
Pages:
11
DOI:
10.1109/16.310108
File:
PDF, 1.12 MB
english, 1994
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