Temperature dependence of the channel hot-carrier...

IEEE Transactions on Electron Devices 1990 Vol. 37; Iss. 4

Temperature dependence of the channel hot-carrier degradation of n-channel MOSFET's

Heremans, P., Van den Bosch, G., Bellens, R., Groeseneken, G., Maes, H.E.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
37
Year:
1990
Language:
english
Pages:
14
DOI:
10.1109/16.52433
File:
PDF, 1.42 MB
english, 1990
Conversion to is in progress
Conversion to is failed